Ismet Bayraktaroglu

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test (BIST) of memory interconnect
- Patent number 7,096,393
- Issue date Aug 22, 2006
- Sun Microsystems, Inc.
- Olivier Caty
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for generating and verifying libraries for ATP...
- Patent number 7,065,724
- Issue date Jun 20, 2006
- Sun Microsystems, Inc.
- Olivier Caty
- G01 - MEASURING TESTING
Information Patent Grant
Concurrently programmable dynamic memory built-in self-test (BIST)
- Patent number 7,062,694
- Issue date Jun 13, 2006
- Sun Microsystems, Inc.
- Olivier Caty
- G11 - INFORMATION STORAGE
Information Patent Grant
Instruction-based built-in self-test (BIST) of external memory
- Patent number 7,020,820
- Issue date Mar 28, 2006
- Sun Microsystems, Inc.
- Olivier Caty
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for generating test pattern for integrated cir...
- Patent number 6,925,617
- Issue date Aug 2, 2005
- Sun Microsystems, Inc.
- Ismet Bayraktaroglu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Concurrently programmable dynamic memory built-in self-test (BIST)
- Publication number 20040158786
- Publication date Aug 12, 2004
- Olivier Caty
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for generating test pattern for integrated cir...
- Publication number 20040143802
- Publication date Jul 22, 2004
- Sun Microsystems, Inc., a Delaware Corporation
- Ismet Bayraktaroglu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for generating and verifying libraries for ATP...
- Publication number 20040143783
- Publication date Jul 22, 2004
- Sun Microsystems, Inc., a Delaware Corporation
- Olivier Caty
- G01 - MEASURING TESTING
Information Patent Application
Instruction-based built-in self-test (BIST) of external memory
- Publication number 20040123200
- Publication date Jun 24, 2004
- Olivier Caty
- G01 - MEASURING TESTING