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Israel Hirsch
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Herzelia, IL
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last 30 patents
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Patent Grant
Matrix for detection/analysis of residues
Patent number
8,988,687
Issue date
Mar 24, 2015
Aphelion Ltd.
Israel Hirsch
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
MATRIX FOR DETECTION/ANALYSIS OF RESIDUES
Publication number
20100238447
Publication date
Sep 23, 2010
APHELION LTD.
Israel Hirsch
G01 - MEASURING TESTING