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Issei Yokoyama
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Kyoto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Optical analyzer
Patent number
11,561,171
Issue date
Jan 24, 2023
HORIBA ADVANCED TECHNO, CO., LTD.
Takuya Onoda
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Spectroscopic analysis method and spectroscopic analyzer
Patent number
9,557,261
Issue date
Jan 31, 2017
HORIBA, Ltd.
Takaaki Yada
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement cell
Patent number
8,390,812
Issue date
Mar 5, 2013
HORIBA, Ltd.
Issei Yokoyama
G01 - MEASURING TESTING
Information
Patent Grant
Measuring method of component concentration in solution
Patent number
6,993,444
Issue date
Jan 31, 2006
Horiba, Ltd.
Issei Yokoyama
G01 - MEASURING TESTING
Information
Patent Grant
Analytical method for multi-component aqueous solutions and apparat...
Patent number
5,886,347
Issue date
Mar 23, 1999
Horiba, Ltd.
Masaru Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Method of analyzing the concentration of components in a solution
Patent number
5,729,342
Issue date
Mar 17, 1998
Horiba, Ltd.
Issei Yokoyama
G01 - MEASURING TESTING
Information
Patent Grant
Isothermal capacitance transient spectroscopy method and apparatus
Patent number
5,206,598
Issue date
Apr 27, 1993
Horiba, Ltd.
Issei Yokoyama
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring luminescence lifetime
Patent number
4,662,748
Issue date
May 5, 1987
Horiba, Ltd.
Masaru Tanaka
G01 - MEASURING TESTING
Information
Patent Grant
Measuring method for a time resolved emission spectrum or a time re...
Patent number
4,632,550
Issue date
Dec 30, 1986
Horiba, Ltd.
Kiyoaki Hara
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring the luminous lifetime of a sample
Patent number
4,600,306
Issue date
Jul 15, 1986
Horiba, Ltd.
Kiyoaki Hara
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring anisotropy of light emitted from the sample
Patent number
4,586,820
Issue date
May 6, 1986
Horiba, Ltd.
Issei Yokoyama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL ANALYZER
Publication number
20200333248
Publication date
Oct 22, 2020
HORIBA ADVANCED TECHNO, CO., LTD.
Takuya ONODA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
GAS CONCENTRATION MEASUREMENT APPARATUS
Publication number
20180003626
Publication date
Jan 4, 2018
HORIBA, Ltd.
Kimihiko ARIMOTO
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC ANALYSIS METHOD AND SPECTROSCOPIC ANALYZER
Publication number
20140185049
Publication date
Jul 3, 2014
HORIBA, Ltd.
Takaaki Yada
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZING APPARATUS
Publication number
20110299083
Publication date
Dec 8, 2011
HORIBA, LTD.
Issei Yokoyama
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT CELL
Publication number
20110299067
Publication date
Dec 8, 2011
HORIBA, Ltd.
Issei Yokoyama
G01 - MEASURING TESTING
Information
Patent Application
Measuring method of component concentration in solution
Publication number
20050065750
Publication date
Mar 24, 2005
Issei Yokoyama
G01 - MEASURING TESTING