ISTVAN BAUER

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MURPHY, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Parametric test program generator
- Patent number 9,606,178
- Issue date Mar 28, 2017
- Texas Instruments Incorporated
- Uwe Peter Schiessl
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fail Density-Based Clustering for Yield Loss Detection
- Publication number 20210181253
- Publication date Jun 17, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Istvan Bauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARAMETRIC TEST PROGRAM GENERATOR
- Publication number 20150253380
- Publication date Sep 10, 2015
- TEXAS INSTRUMENTS INCORPORATED
- UWE PETER SCHIESSL
- G01 - MEASURING TESTING