Isuke Hirano

Person

Shizuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Voltage detection apparatus
- Patent number 5,703,491
- Issue date Dec 30, 1997
- Hamamatsu Photonics K.K.
- Takuya Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic apparatus for measuring an electric field of a sample
- Patent number 5,592,101
- Issue date Jan 7, 1997
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detection apparatus
- Patent number 5,583,444
- Issue date Dec 10, 1996
- Hamamatsu Photonics K.K.
- Takuya Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of positioning an electrooptic probe of an apparatus for the...
- Patent number 5,552,716
- Issue date Sep 3, 1996
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
E-O probe
- Patent number 5,500,587
- Issue date Mar 19, 1996
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring timing relationship between two signals
- Patent number 5,499,190
- Issue date Mar 12, 1996
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measuring apparatus having an electro-optic member
- Patent number 5,444,365
- Issue date Aug 22, 1995
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Light pulse intensity regenerator, light tranforming repeater, pre-...
- Patent number 5,350,913
- Issue date Sep 27, 1994
- Hamamatsu Photonics K.K.
- Shinichiro Aoshima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pulsed laser beam source device
- Patent number 5,319,654
- Issue date Jun 7, 1994
- Hamamatsu Photonics K.K.
- Tsuneyuki Urakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical device and apparatus using the optical device
- Patent number 5,311,350
- Issue date May 10, 1994
- Hamamatsu Photonics K.K.
- Mitsuo Hiramatsu
- G02 - OPTICS
Information Patent Grant
Polarized light measuring apparatus and phase plate measuring appar...
- Patent number 5,237,388
- Issue date Aug 17, 1993
- Hamamatsu Photonics K.K.
- Isuke Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Angle-of-optical-rotation variation measuring apparatus
- Patent number 4,762,418
- Issue date Aug 9, 1988
- Hamamatsu Photonics Kabushiki Kaisha
- Toshiaki Ito
- G01 - MEASURING TESTING

Isuke Hirano

Person

Patents Grantslast 30 patents

Voltage detection apparatus

Electro-optic apparatus for measuring an electric field of a sample

Voltage detection apparatus

Method of positioning an electrooptic probe of an apparatus for the...

E-O probe

System for measuring timing relationship between two signals

Voltage measuring apparatus having an electro-optic member

Light pulse intensity regenerator, light tranforming repeater, pre-...

Pulsed laser beam source device

Optical device and apparatus using the optical device

Polarized light measuring apparatus and phase plate measuring appar...

Angle-of-optical-rotation variation measuring apparatus