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Itaru Iida
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Yamanashi-ken, JP
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last 30 patents
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Patent Grant
Screening method of semiconductor device and apparatus thereof
Patent number
6,380,753
Issue date
Apr 30, 2002
Tokyo Electron Limited
Shinji Iino
G01 - MEASURING TESTING
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Patent Grant
System for testing semiconductor device formed on semiconductor wafer
Patent number
6,268,740
Issue date
Jul 31, 2001
Tokyo Electron Limited
Itaru Iida
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for examining target objects such as LCD panels
Patent number
5,691,764
Issue date
Nov 25, 1997
Tokyo Electron Limited
Kiyoshi Takekoshi
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
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Patent Grant
Probe apparatus having burn-in test function
Patent number
5,568,054
Issue date
Oct 22, 1996
Tokyo Electron Limited
Shinji Iino
G01 - MEASURING TESTING