Itaru Kitajima

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe aligning method for probe microscope and probe microscope ope...
- Patent number 8,495,759
- Issue date Jul 23, 2013
- SII NanoTechnology Inc.
- Shigeru Wakiyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for fabricating nanometer-scale structure
- Patent number 7,476,418
- Issue date Jan 13, 2009
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and scanning method
- Patent number 7,373,806
- Issue date May 20, 2008
- SII NanoTechnology Inc.
- Itaru Kitajima
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever holder and scanning probe microscope
- Patent number 7,375,322
- Issue date May 20, 2008
- SII NanoTechnology Inc.
- Itaru Kitajima
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 7,026,607
- Issue date Apr 11, 2006
- SII NanoTechnology Inc.
- Itaru Kitajima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE ALIGNING METHOD FOR PROBE MICROSCOPE AND PROBE MICROSCOPE OPE...
- Publication number 20100031402
- Publication date Feb 4, 2010
- Shigeru Wakiyama
- G01 - MEASURING TESTING
Information Patent Application
Cantilever holder and scanning probe microscope
- Publication number 20060219916
- Publication date Oct 5, 2006
- Itaru Kitajima
- G01 - MEASURING TESTING
Information Patent Application
Method for fabricating nanometer-scale structure
- Publication number 20050089463
- Publication date Apr 28, 2005
- Masatoshi Yasutake
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Scanning probe microscope and scanning method
- Publication number 20050050947
- Publication date Mar 10, 2005
- Itaru Kitajima
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20040227076
- Publication date Nov 18, 2004
- Itaru Kitajima
- G01 - MEASURING TESTING