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Itaru MIYAZAKI
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Kanagawa, JP
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last 30 patents
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Patent Grant
X-ray inspection apparatus and correction method for X-ray inspecti...
Patent number
10,718,725
Issue date
Jul 21, 2020
ANRITSU INFIVIS CO., LTD.
Itaru Miyazaki
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
X-RAY INSPECTION APPARATUS
Publication number
20200116877
Publication date
Apr 16, 2020
ANRITSU INFIVIS CO., LTD.
Naoya SAITO
G01 - MEASURING TESTING
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Patent Application
X-RAY INSPECTION APPARATUS AND CORRECTION METHOD FOR X-RAY INSPECTI...
Publication number
20190003989
Publication date
Jan 3, 2019
ANRITSU INFIVIS CO., LTD.
Itaru MIYAZAKI
G06 - COMPUTING CALCULATING COUNTING