Itaru Takao

Person

  • Yamanashi, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Probing device setting a probe card parallel

    • Patent number 5,410,259
    • Issue date Apr 25, 1995
    • Tokyo Electron Yamanashi Limited
    • Hitoshi Fujihara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe apparatus

    • Patent number 5,086,270
    • Issue date Feb 4, 1992
    • Tokyo Electron Limited
    • Wataru Karasawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method for holding a plate-like member

    • Patent number 5,065,495
    • Issue date Nov 19, 1991
    • Tokyo Electron Limited
    • Masaki Narushima
    • B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
  • Information Patent Grant

    Plate-like member receiving apparatus

    • Patent number 4,955,590
    • Issue date Sep 11, 1990
    • Tokyo Electron Limited
    • Masaki Narushima
    • B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
  • Information Patent Grant

    Transfer apparatus for plate-like member

    • Patent number 4,941,800
    • Issue date Jul 17, 1990
    • Tokyo Electron Limited
    • Hisashi Koike
    • H01 - BASIC ELECTRIC ELEMENTS