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Itaru Takao
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Yamanashi, JP
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last 30 patents
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Patent Grant
Probing device setting a probe card parallel
Patent number
5,410,259
Issue date
Apr 25, 1995
Tokyo Electron Yamanashi Limited
Hitoshi Fujihara
G01 - MEASURING TESTING
Information
Patent Grant
Probe apparatus
Patent number
5,086,270
Issue date
Feb 4, 1992
Tokyo Electron Limited
Wataru Karasawa
G01 - MEASURING TESTING
Information
Patent Grant
Method for holding a plate-like member
Patent number
5,065,495
Issue date
Nov 19, 1991
Tokyo Electron Limited
Masaki Narushima
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Plate-like member receiving apparatus
Patent number
4,955,590
Issue date
Sep 11, 1990
Tokyo Electron Limited
Masaki Narushima
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Transfer apparatus for plate-like member
Patent number
4,941,800
Issue date
Jul 17, 1990
Tokyo Electron Limited
Hisashi Koike
H01 - BASIC ELECTRIC ELEMENTS