Itay Gdor

Person

Halevi, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Targets for diffraction-based overlay error metrology
- Patent number 12,105,414
- Issue date Oct 1, 2024
- KLA Corporation
- Itay Gdor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Annular apodizer for small target overlay measurement
- Patent number 12,105,431
- Issue date Oct 1, 2024
- KLA Corporation
- Itay Gdor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning overlay metrology using overlay targets having multiple sp...
- Patent number 11,796,925
- Issue date Oct 24, 2023
- KLA Corporation
- Yuval Lubashevsky
- G01 - MEASURING TESTING
Information Patent Grant
Non-orthogonal target and method for using the same in measuring mi...
- Patent number 11,409,205
- Issue date Aug 9, 2022
- KLA Corporation
- Itay Gdor
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
On-the-fly scatterometry overlay metrology target
- Patent number 11,378,394
- Issue date Jul 5, 2022
- KLA Corporation
- Yuri Paskover
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION
- Publication number 20240402615
- Publication date Dec 5, 2024
- KLA Corporation
- Yaniv Weiss
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING...
- Publication number 20240337952
- Publication date Oct 10, 2024
- KLA Corporation
- Itay Gdor
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR TRACKING REAL-TIME POSITION FOR SCANNING OVER...
- Publication number 20240337953
- Publication date Oct 10, 2024
- KLA Corporation
- Itay Gdor
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MULTI-OVERLAY STACKED GRATING METROLOGY TARGET
- Publication number 20240302751
- Publication date Sep 12, 2024
- KLA Corporation
- Jordan Pio
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR SUPPRESSION OF TOOL INDUCED SHIFT IN SCANNING...
- Publication number 20240167813
- Publication date May 23, 2024
- KLA Corporation
- Itay Gdor
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED TARGETS FOR DIFFRACTION-BASED OVERLAY ERROR METROLOGY
- Publication number 20240118606
- Publication date Apr 11, 2024
- KLA Corporation
- Itay GDOR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-PITCH GRID OVERLAY TARGET FOR SCANNING OVERLAY METROLOGY
- Publication number 20240068804
- Publication date Feb 29, 2024
- KLA Corporation
- Yuval Lubashevsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ISOLATION OF SPECIFIC FOURIER PUPIL FREQUENCY...
- Publication number 20230314344
- Publication date Oct 5, 2023
- Yuri Paskover
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SCATTEROMETRY OVERLAY METROLOGY
- Publication number 20230314319
- Publication date Oct 5, 2023
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
ANNULAR APODIZER FOR SMALL TARGET OVERLAY MEASUREMENT
- Publication number 20230236113
- Publication date Jul 27, 2023
- KLA Corporation
- Itay GDOR
- G01 - MEASURING TESTING
Information Patent Application
SCANNING OVERLAY METROLOGY USING OVERLAY TARGETS HAVING MULTIPLE SP...
- Publication number 20230213875
- Publication date Jul 6, 2023
- Yuval Lubashevsky
- G01 - MEASURING TESTING
Information Patent Application
ON-THE-FLY SCATTEROMETRY OVERLAY METROLOGY TARGET
- Publication number 20220187062
- Publication date Jun 16, 2022
- KLA Corporation
- Yuri Paskover
- G01 - MEASURING TESTING
Information Patent Application
Non-Orthogonal Target and Method for Using the Same in Measuring Mi...
- Publication number 20210364935
- Publication date Nov 25, 2021
- Itay Gdor
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

Targets for diffraction-based overlay error metrology

Annular apodizer for small target overlay measurement

Scanning overlay metrology using overlay targets having multiple sp...

Non-orthogonal target and method for using the same in measuring mi...

On-the-fly scatterometry overlay metrology target

Patents Applicationslast 30 patents

SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION

SYSTEM AND METHOD FOR DETERMINING OVERLAY MEASUREMENT OF A SCANNING...

SYSTEM AND METHOD FOR TRACKING REAL-TIME POSITION FOR SCANNING OVER...

MULTI-OVERLAY STACKED GRATING METROLOGY TARGET

SYSTEM AND METHOD FOR SUPPRESSION OF TOOL INDUCED SHIFT IN SCANNING...

IMPROVED TARGETS FOR DIFFRACTION-BASED OVERLAY ERROR METROLOGY

MULTI-PITCH GRID OVERLAY TARGET FOR SCANNING OVERLAY METROLOGY

SYSTEM AND METHOD FOR ISOLATION OF SPECIFIC FOURIER PUPIL FREQUENCY...

SCANNING SCATTEROMETRY OVERLAY METROLOGY

ANNULAR APODIZER FOR SMALL TARGET OVERLAY MEASUREMENT

SCANNING OVERLAY METROLOGY USING OVERLAY TARGETS HAVING MULTIPLE SP...

ON-THE-FLY SCATTEROMETRY OVERLAY METROLOGY TARGET

Non-Orthogonal Target and Method for Using the Same in Measuring Mi...