Itzik Nisany

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Herzeliya, IL

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Patents Grantslast 30 patents

Information Patent Grant
Wafer inspection system and a method for translating wafers
- Patent number 8,573,077
- Issue date Nov 5, 2013
- Camtek Ltd.
- Itzik Nisany
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Wafer inspection system and a method for translating wafers [PD]
- Patent number 8,281,674
- Issue date Oct 9, 2012
- Camtek Ltd.
- Itzik Nisany
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION SYSTEM AND A METHOD FOR TRANSLATING WAFERS
- Publication number 20130115030
- Publication date May 9, 2013
- Camtek LTD.
- Itzik Nisany
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
WAFER INSPECTION SYSTEM AND A METHOD FOR TRANSLATING WAFERS [PD]
- Publication number 20090183583
- Publication date Jul 23, 2009
- Itzik Nisany
- G01 - MEASURING TESTING