Ivan Lazic

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for simultaneous phase contrast imaging and elect...
- Patent number 11,211,223
- Issue date Dec 28, 2021
- FEI Company
- Ivan Lazić
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Discriminative imaging technique in scanning transmission charged p...
- Patent number 10,699,872
- Issue date Jun 30, 2020
- FEI Company
- Eric Gerardus Bosch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intelligent pre-scan in scanning transmission charged particle micr...
- Patent number 10,665,419
- Issue date May 26, 2020
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam scanning transmission charged particle microscope
- Patent number 10,607,811
- Issue date Mar 31, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing tomographic imaging in a charged-particle micr...
- Patent number 10,573,488
- Issue date Feb 25, 2020
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging technique in scanning transmission charged particle microscopy
- Patent number 10,446,366
- Issue date Oct 15, 2019
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing tomographic imaging in a charged-particle micr...
- Patent number 10,403,469
- Issue date Sep 3, 2019
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of ptychographic imaging
- Patent number 9,959,639
- Issue date May 1, 2018
- FEI Company
- Eric Gerardus Theodoor Bosch
- G02 - OPTICS
Information Patent Grant
Method of examining a sample in a charged-particle microscope
- Patent number 9,312,098
- Issue date Apr 12, 2016
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of investigating the wavefront of a charged-particle beam
- Patent number 9,202,670
- Issue date Dec 1, 2015
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of investigating and correcting aberrations in a charged-par...
- Patent number 9,136,087
- Issue date Sep 15, 2015
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing and imaging a lamella in a particle-optical app...
- Patent number 8,766,214
- Issue date Jul 1, 2014
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and Scanning Transmission Charged-Particle Microscope
- Publication number 20230352269
- Publication date Nov 2, 2023
- FEI Company
- Eric Bosch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERFORMING TOMOGRAPHIC IMAGING IN A CHARGED-PARTICLE MICR...
- Publication number 20190348254
- Publication date Nov 14, 2019
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTELLIGENT PRE-SCAN IN SCANNING TRANSMISSION CHARGED PARTICLE MICR...
- Publication number 20190295814
- Publication date Sep 26, 2019
- FEI Company
- Erik Michiel FRANKEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISCRIMINATIVE IMAGING TECHNIQUE IN SCANNING TRANSMISSION CHARGED P...
- Publication number 20190272974
- Publication date Sep 5, 2019
- FEI Company
- Eric Gerardus BOSCH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PTYCHOGRAPHIC IMAGING
- Publication number 20170024908
- Publication date Jan 26, 2017
- FEI Company
- Eric Gerardus Theodoor Bosch
- G02 - OPTICS
Information Patent Application
METHOD OF PERFORMING TOMOGRAPHIC IMAGING IN A CHARGED-PARTICLE MICR...
- Publication number 20160307729
- Publication date Oct 20, 2016
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE
- Publication number 20150243474
- Publication date Aug 27, 2015
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INVESTIGATING THE WAVEFRONT OF A CHARGED-PARTICLE BEAM
- Publication number 20150170876
- Publication date Jun 18, 2015
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Investigating and Correcting Aberrations in a Charged-Par...
- Publication number 20140061464
- Publication date Mar 6, 2014
- FEI Company
- Ivan Lazic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...
- Publication number 20140007307
- Publication date Jan 2, 2014
- Brian Roberts Routh
- B82 - NANO-TECHNOLOGY

Person

Patents Grantslast 30 patents

System and method for simultaneous phase contrast imaging and elect...

Discriminative imaging technique in scanning transmission charged p...

Intelligent pre-scan in scanning transmission charged particle micr...

Multi-beam scanning transmission charged particle microscope

Method of performing tomographic imaging in a charged-particle micr...

Imaging technique in scanning transmission charged particle microscopy

Method of performing tomographic imaging in a charged-particle micr...

Method of ptychographic imaging

Method of examining a sample in a charged-particle microscope

Method of investigating the wavefront of a charged-particle beam

Method of investigating and correcting aberrations in a charged-par...

Method of preparing and imaging a lamella in a particle-optical app...

Patents Applicationslast 30 patents

Method and Scanning Transmission Charged-Particle Microscope

METHOD OF PERFORMING TOMOGRAPHIC IMAGING IN A CHARGED-PARTICLE MICR...

INTELLIGENT PRE-SCAN IN SCANNING TRANSMISSION CHARGED PARTICLE MICR...

DISCRIMINATIVE IMAGING TECHNIQUE IN SCANNING TRANSMISSION CHARGED P...

METHOD OF PTYCHOGRAPHIC IMAGING

METHOD OF PERFORMING TOMOGRAPHIC IMAGING IN A CHARGED-PARTICLE MICR...

METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE

METHOD OF INVESTIGATING THE WAVEFRONT OF A CHARGED-PARTICLE BEAM

Method of Investigating and Correcting Aberrations in a Charged-Par...

METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...