Ivan Michel ANTOLOVIC

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Lausanne, CH

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Patents Grantslast 30 patents

Information Patent Grant
Light microscope with reconfigurable sensor array
- Patent number 12,204,082
- Issue date Jan 21, 2025
- Carl Zeiss Microscopy GmbH
- Tiemo Anhut
- G01 - MEASURING TESTING
Information Patent Grant
Low-power image sensor system with single-photon avalanche diode ph...
- Patent number 12,192,656
- Issue date Jan 7, 2025
- Ecole Polytechnique Federale de Lausanne
- Ivan Michel Antolovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light microscope with photon-counting detector elements and imaging...
- Patent number 12,055,700
- Issue date Aug 6, 2024
- Carl Zeiss Microscopy GmbH
- Tiemo Anhut
- G01 - MEASURING TESTING
Information Patent Grant
System, device, and method for quantum correlation measurement with...
- Patent number 11,982,566
- Issue date May 14, 2024
- Ecole Polytechnique Federale de Lausanne (EPFL)
- Ivan Michel Antolovic
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND LIGHT MICROSCOPE WITH A PLURALITY OF ARRAYS OF PHOTON-CO...
- Publication number 20230288687
- Publication date Sep 14, 2023
- CARL ZEISS MICROSCOPY GMBH
- Tiemo ANHUT
- G01 - MEASURING TESTING
Information Patent Application
LOW-POWER IMAGE SENSOR SYSTEM WITH SINGLE-PHOTON AVALANCHE DIODE PH...
- Publication number 20220264047
- Publication date Aug 18, 2022
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
- Ivan Michel ANTOLOVIC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT MICROSCOPE WITH RECONFIGURABLE SENSOR ARRAY
- Publication number 20220206275
- Publication date Jun 30, 2022
- CARL ZEISS MICROSCOPY GMBH
- Tiemo ANHUT
- G01 - MEASURING TESTING
Information Patent Application
System, Device, and Method for Quantum Correlation Measurement With...
- Publication number 20220170784
- Publication date Jun 2, 2022
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
- Ivan Michel Antolovic
- G01 - MEASURING TESTING
Information Patent Application
LIGHT MICROSCOPE WITH PHOTON-COUNTING DETECTOR ELEMENTS AND IMAGING...
- Publication number 20220075171
- Publication date Mar 10, 2022
- CARL ZEISS MICROSCOPY GMBH
- Tiemo ANHUT
- G01 - MEASURING TESTING