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Ivan PENJOVIC

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  • Munich, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Wafer probing
    • Patent number 10,598,480
    • Issue date Mar 24, 2020
    • Infineon Technologies AG
    • Ivan Penjovic
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe-pad qualification
    • Patent number 9,885,749
    • Issue date Feb 6, 2018
    • Infineon Technologies AG
    • Ivan Penjovic
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    WAFER PROBING
    • Publication number 20170292832
    • Publication date Oct 12, 2017
    • INFINEON TECHNOLOGIES AG
    • Ivan Penjovic
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE-PAD QUALIFICATION
    • Publication number 20160356844
    • Publication date Dec 8, 2016
    • INFINEON TECHNOLOGIES AG
    • Ivan PENJOVIC
    • G01 - MEASURING TESTING