Ivanisevic Igor

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West Lafayette, IN, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for matching diffraction patterns
- Patent number 7,715,527
- Issue date May 11, 2010
- Aptuit (Kansas City), LLC
- Igor Ivanisevic
- G01 - MEASURING TESTING
Information Patent Grant
System and method for matching diffraction patterns
- Patent number 7,372,941
- Issue date May 13, 2008
- S.S.C.I., Inc.
- Igor Ivanisevic
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR ASSESSING THE MISCIBILITY OF COMPOSITIONS
- Publication number 20110184659
- Publication date Jul 28, 2011
- Simon Bates
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Matching Diffraction Patterns
- Publication number 20080120051
- Publication date May 22, 2008
- SSCI, INC.
- Igor IVANISEVIC
- G01 - MEASURING TESTING
Information Patent Application
Method for Indexing Crystalline Solid Forms
- Publication number 20070270397
- Publication date Nov 22, 2007
- Simon Bates
- G01 - MEASURING TESTING
Information Patent Application
Analysis and Screening of Solid Forms Using the Atomic Pair Distrib...
- Publication number 20070243620
- Publication date Oct 18, 2007
- Simon Bates
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for x-ray diffraction analysis
- Publication number 20040234030
- Publication date Nov 25, 2004
- Jesse R. Miller
- G01 - MEASURING TESTING
Information Patent Application
System and method for matching diffraction patterns
- Publication number 20040103130
- Publication date May 27, 2004
- Igor Ivanisevic
- G01 - MEASURING TESTING