Ivo Ihrke

Follow

Person

Scheuerfeld, DE

People

Patents Applicationslast 30 patents

Information Patent Application
METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...
- Publication number 20240404786
- Publication date Dec 5, 2024
- Carl Zeiss SMT GMBH
- Ivo IHRKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPERATING A PARTICLE BEAM MICROSCOPE, PARTICLE BEAM MICR...
- Publication number 20230011964
- Publication date Jan 12, 2023
- CARL ZEISS MICROSCOPY GMBH
- Martin Ross-Messemer
- H01 - BASIC ELECTRIC ELEMENTS