Iyun Leu

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
- Patent number 11,774,372
- Issue date Oct 3, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
- Patent number 11,774,373
- Issue date Oct 3, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart defect calibration system in semiconductor wafer manufacturing
- Patent number 11,761,904
- Issue date Sep 19, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for performing smart semiconductor wafer defect calibration
- Patent number 11,719,650
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart conversion and calibration of coordinate
- Patent number 11,719,649
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart conversion and calibration of coordinate
- Patent number 11,719,648
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart defect calibration system and the method thereof
- Patent number 11,016,035
- Issue date May 25, 2021
- Elite Semiconductor Inc.
- Iyun Leu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor Fab's defect operating system and method thereof
- Patent number 10,726,192
- Issue date Jul 28, 2020
- ELITE SEMICONDUCTOR INC.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for quickly diagnosing, classifying, and sampling...
- Patent number 10,719,655
- Issue date Jul 21, 2020
- Elite Semiconductor, Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent CAA failure pre-diagnosis method and system for design...
- Patent number 10,409,924
- Issue date Sep 10, 2019
- Elite Semiconductor, Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for intelligent weak pattern diagnosis, and non-t...
- Patent number 10,312,164
- Issue date Jun 4, 2019
- Elite Semiconductor, Inc.
- Iyun Leu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for intelligent defect classification and samplin...
- Patent number 10,228,421
- Issue date Mar 12, 2019
- Elite Semiconductor, Inc.
- Iyun Leu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated interfacing system and method for intelligent defect yie...
- Patent number 9,129,237
- Issue date Sep 8, 2015
- Elitetech Technology Co., Ltd.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for building rule of thumb of defect classification, and met...
- Patent number 8,908,957
- Issue date Dec 9, 2014
- Elitetech Technology Co.,Ltd.
- Iyun Leu
- G01 - MEASURING TESTING
Information Patent Grant
Integrated design-for-manufacturing platform
- Patent number 8,863,056
- Issue date Oct 14, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Iyun Kevin Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent defect diagnosis method
- Patent number 8,607,169
- Issue date Dec 10, 2013
- Elitetech Technology Co., Ltd.
- Iyun Leu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for utilizing fabrication defect of an article
- Patent number 8,473,223
- Issue date Jun 25, 2013
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart defect screen and sample
- Patent number 8,312,401
- Issue date Nov 13, 2012
- Elitetech Technology Co., Ltd.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for defect diagnosis and management
- Patent number 8,095,895
- Issue date Jan 10, 2012
- Iyun Leu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...
- Publication number 20210231582
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
SMART DEFECT CALIBRATION SYSTEM IN SEMICONDUCTOR WAFER MANUFACTURING
- Publication number 20210231584
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE
- Publication number 20210231580
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PERFORMING SMART SEMICONDUCTOR WAFER DEFECT CALIBRATION
- Publication number 20210231581
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE
- Publication number 20210231579
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...
- Publication number 20210231583
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAB'S DEFECT OPERATING SYSTEM AND METHOD THEREOF
- Publication number 20200026819
- Publication date Jan 23, 2020
- ELITE SEMICONDUCTOR INC.
- Iyun LEU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMART DEFECT CALIBRATION SYSTEM AND THE METHOD THEREOF
- Publication number 20190086340
- Publication date Mar 21, 2019
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR QUICKLY DIAGNOSING, CLASSIFYING, AND SAMPLING...
- Publication number 20190026419
- Publication date Jan 24, 2019
- ELITE SEMICONDUCTOR, INC.
- IYUN LEU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTELLIGENT CAA FAILURE PRE-DIAGNOSIS METHOD AND SYSTEM FOR DESIGN...
- Publication number 20180293334
- Publication date Oct 11, 2018
- ELITE SEMICONDUCTOR, INC.
- IYUN LEU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR INTELLIGENT DEFECT CLASSIFICATION AND SAMPLIN...
- Publication number 20170212168
- Publication date Jul 27, 2017
- ELITE SEMICONDUCTOR, INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INTELLIGENT WEAK PATTERN DIAGNOSIS, AND NON-T...
- Publication number 20140343884
- Publication date Nov 20, 2014
- ELITETECH TECHNOLOGY CO.,LTD.
- IYUN LEU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTELLIGENT DEFECT DIAGNOSIS METHOD
- Publication number 20130174102
- Publication date Jul 4, 2013
- ELITETECH TECHNOLOGY CO.,LTD.
- IYUN LEU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR BUILDING RULE OF THUMB OF DEFECT CLASSIFICATION, AND MET...
- Publication number 20130170733
- Publication date Jul 4, 2013
- ELITETECH TECHNOLOGY CO.,LTD.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED INTERFACING SYSTEM AND METHOD FOR INTELLIGENT DEFECT YIE...
- Publication number 20130173041
- Publication date Jul 4, 2013
- ELITETECH TECHNOLOGY CO.,LTD.
- IYUN LEU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR SMART DEFECT SCREEN AND SAMPLE
- Publication number 20120185818
- Publication date Jul 19, 2012
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR UTILIZING FABRICATION DEFECT OF AN ARTICLE
- Publication number 20110082650
- Publication date Apr 7, 2011
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR SIMULATING LEAKAGE DISTRIBUTION OF INTEGRATED CIRCUIT DE...
- Publication number 20100332206
- Publication date Dec 30, 2010
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for defect diagnosis and management
- Publication number 20100180239
- Publication date Jul 15, 2010
- Iyun Leu
- G01 - MEASURING TESTING
Information Patent Application
Integrated Design-for-Manufacturing Platform
- Publication number 20090055011
- Publication date Feb 26, 2009
- Iyun Kevin Leu
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Smart coordinate conversion and calibration system in semiconductor...

Smart coordinate conversion and calibration system in semiconductor...

Smart defect calibration system in semiconductor wafer manufacturing

Method for performing smart semiconductor wafer defect calibration

Method for smart conversion and calibration of coordinate

Method for smart conversion and calibration of coordinate

Smart defect calibration system and the method thereof

Semiconductor Fab's defect operating system and method thereof

Method and system for quickly diagnosing, classifying, and sampling...

Intelligent CAA failure pre-diagnosis method and system for design...

Method and system for intelligent weak pattern diagnosis, and non-t...

Method and system for intelligent defect classification and samplin...

Integrated interfacing system and method for intelligent defect yie...

Method for building rule of thumb of defect classification, and met...

Integrated design-for-manufacturing platform

Intelligent defect diagnosis method

Method for utilizing fabrication defect of an article

Method for smart defect screen and sample

Method for defect diagnosis and management

Patents Applicationslast 30 patents

SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...

SMART DEFECT CALIBRATION SYSTEM IN SEMICONDUCTOR WAFER MANUFACTURING

METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE

METHOD FOR PERFORMING SMART SEMICONDUCTOR WAFER DEFECT CALIBRATION

METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE

SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...

SEMICONDUCTOR FAB'S DEFECT OPERATING SYSTEM AND METHOD THEREOF

SMART DEFECT CALIBRATION SYSTEM AND THE METHOD THEREOF

METHOD AND SYSTEM FOR QUICKLY DIAGNOSING, CLASSIFYING, AND SAMPLING...

INTELLIGENT CAA FAILURE PRE-DIAGNOSIS METHOD AND SYSTEM FOR DESIGN...

METHOD AND SYSTEM FOR INTELLIGENT DEFECT CLASSIFICATION AND SAMPLIN...

METHOD AND SYSTEM FOR INTELLIGENT WEAK PATTERN DIAGNOSIS, AND NON-T...

INTELLIGENT DEFECT DIAGNOSIS METHOD

METHOD FOR BUILDING RULE OF THUMB OF DEFECT CLASSIFICATION, AND MET...

INTEGRATED INTERFACING SYSTEM AND METHOD FOR INTELLIGENT DEFECT YIE...

METHOD FOR SMART DEFECT SCREEN AND SAMPLE

METHOD FOR UTILIZING FABRICATION DEFECT OF AN ARTICLE

METHOD FOR SIMULATING LEAKAGE DISTRIBUTION OF INTEGRATED CIRCUIT DE...

Method for defect diagnosis and management

Integrated Design-for-Manufacturing Platform