Izuru Chiyo

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 11,651,936
- Issue date May 16, 2023
- Jeol Ltd.
- Naoki Fujimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and aberration correction...
- Patent number 11,087,951
- Issue date Aug 10, 2021
- Jeol Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20220189731
- Publication date Jun 16, 2022
- JEOL Ltd.
- Naoki Fujimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Transmission Electron Microscope and Aberration Correction...
- Publication number 20200266025
- Publication date Aug 20, 2020
- JEOL Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS