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J. Albert Schultz
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Houston, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
Patent number
11,391,681
Issue date
Jul 19, 2022
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
Patent number
10,876,982
Issue date
Dec 29, 2020
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
Patent number
10,446,383
Issue date
Oct 15, 2019
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Nanoparticulate assisted nanoscale molecular imaging by mass spectr...
Patent number
9,297,761
Issue date
Mar 29, 2016
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-flight spectrometry and spectroscopy of surfaces
Patent number
8,829,428
Issue date
Sep 9, 2014
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Nonoparticulate assisted nanoscale molecular imaging by mass spectr...
Patent number
8,614,416
Issue date
Dec 24, 2013
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Post-ionization of neutrals for ion mobility oTOFMS identification...
Patent number
8,558,168
Issue date
Oct 15, 2013
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-flight mass spectrometry of surfaces
Patent number
8,519,329
Issue date
Aug 27, 2013
Ionwerks, Inc.
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
Patent number
8,492,710
Issue date
Jul 23, 2013
Ionwerks, Inc.
Katrin Fuhrer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Post-ionization of neutrals for ion mobility oTOFMS identification...
Patent number
8,384,023
Issue date
Feb 26, 2013
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Neutral/ion reactor in adiabatic supersonic gas flow for ion mobili...
Patent number
8,129,675
Issue date
Mar 6, 2012
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Multi-beam ion mobility time-of-flight mass spectrometry with multi...
Patent number
8,115,167
Issue date
Feb 14, 2012
Ionwerks, Inc.
Valeri V. Raznikov
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-flight mass spectrometry of surfaces
Patent number
8,101,909
Issue date
Jan 24, 2012
Ionwerks, Inc.
Thomas F. Egan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fast time-of-flight mass spectrometer with improved dynamic range
Patent number
7,800,054
Issue date
Sep 21, 2010
Ionwerks, Inc.
Katrin Fuhrer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiplex data acquisition modes for ion mobility-mass spectrometry
Patent number
7,745,780
Issue date
Jun 29, 2010
Ionwerks, Inc.
John A. McLean
G01 - MEASURING TESTING
Information
Patent Grant
Gold implantation/deposition of biological samples for laser desorp...
Patent number
7,629,576
Issue date
Dec 8, 2009
Ionwerks, Inc.
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Neutral/Ion reactor in adiabatic supersonic gas flow for ion mobili...
Patent number
7,547,878
Issue date
Jun 16, 2009
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Multi-beam ion mobility time-of-flight mass spectrometry with multi...
Patent number
7,482,582
Issue date
Jan 27, 2009
Ionwerks, Inc.
Valeri V. Raznikov
G01 - MEASURING TESTING
Information
Patent Grant
Multi-beam ion mobility time-of-flight mass spectrometer with bipol...
Patent number
7,429,729
Issue date
Sep 30, 2008
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
Patent number
7,365,313
Issue date
Apr 29, 2008
Ionwerks
Katrin Fuhrer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
Patent number
7,291,834
Issue date
Nov 6, 2007
Ionwerks, Inc.
Marc Gonin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion mobility TOF/MALDI/MS using drift cell alternating high and low...
Patent number
7,223,969
Issue date
May 29, 2007
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
MALDI-IM-ortho-TOF mass spectrometry with simultaneous positive and...
Patent number
7,170,052
Issue date
Jan 30, 2007
Ionwerks, Inc.
Hiroshi Furutani
G01 - MEASURING TESTING
Information
Patent Grant
Ion mobility spectrometer
Patent number
7,164,122
Issue date
Jan 16, 2007
Ionwerks, Inc.
Katrin Fuhrer
G01 - MEASURING TESTING
Information
Patent Grant
Multi-anode detector with increased dynamic range for time-of-fligh...
Patent number
7,145,134
Issue date
Dec 5, 2006
Ionwerks, Inc.
Marc Gonin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fast time-of-flight mass spectrometer with improved data acquisitio...
Patent number
7,084,393
Issue date
Aug 1, 2006
Ionwerks, Inc.
Katrin Fuhrer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-of-flight mass spectrometer for monitoring of fast processes
Patent number
7,084,395
Issue date
Aug 1, 2006
Ionwerks, Inc.
Katrin Fuhrer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas-phase purification of biomolecules by ion mobility for patterni...
Patent number
7,081,617
Issue date
Jul 25, 2006
Ionwerks, Inc.
John A. McLean
G01 - MEASURING TESTING
Information
Patent Grant
Ion mobility TOF/MALDI/MS using drift cell alternating high and low...
Patent number
6,992,284
Issue date
Jan 31, 2006
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Grant
Gold implantation/deposition of biological samples for laser desorp...
Patent number
6,989,528
Issue date
Jan 24, 2006
Ionwerks, Inc.
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
Publication number
20220404298
Publication date
Dec 22, 2022
Ionwerks, Inc.
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
Publication number
20210116402
Publication date
Apr 22, 2021
Ionwerks, Inc.
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
Publication number
20200013606
Publication date
Jan 9, 2020
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
Publication number
20170221691
Publication date
Aug 3, 2017
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTR...
Publication number
20160189942
Publication date
Jun 30, 2016
Ionwerks, Inc.
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Nanoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...
Publication number
20140084153
Publication date
Mar 27, 2014
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
POST-IONIZATION OF NEUTRALS FOR ION MOBILITY oTOFMS IDENTIFICATION...
Publication number
20130134305
Publication date
May 30, 2013
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACE
Publication number
20120085898
Publication date
Apr 12, 2012
Ionwerks, Inc.
Thomas F. Egan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Nonoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectr...
Publication number
20120018630
Publication date
Jan 26, 2012
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT SPECTROMETRY AND SPECTROSCOPY OF SURFACES
Publication number
20110147578
Publication date
Jun 23, 2011
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DATA ACQUISITIO...
Publication number
20110049355
Publication date
Mar 3, 2011
Ionwerks, Inc.
Katrin Fuhrer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POST-IONIZATION OF NEUTRALS FOR ION MOBILITY OTOFMS IDENTIFICATION...
Publication number
20100200742
Publication date
Aug 12, 2010
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
GOLD IMPLANTATION/DEPOSITION OF BIOLOGICAL SAMPLES FOR LASER DESORP...
Publication number
20100090101
Publication date
Apr 15, 2010
Ionwerks, Inc.
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NEUTRAL/ION REACTOR IN ADIABATIC SUPERSONIC GAS FLOW FOR ION MOBILI...
Publication number
20090309015
Publication date
Dec 17, 2009
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACES
Publication number
20090189072
Publication date
Jul 30, 2009
Ionwerks, Inc.
Thomas F. Egan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-BEAM ION MOBILITY TIME-OF-FLIGHT MASS SPECTROMETRY WITH MULTI...
Publication number
20090140140
Publication date
Jun 4, 2009
Valeri V. Raznikov
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLEX DATA ACQUISITION MODES FOR ION MOBILITY-MASS SPECTROMETRY
Publication number
20090101810
Publication date
Apr 23, 2009
John A. McLean
G01 - MEASURING TESTING
Information
Patent Application
MULTI-BEAM ION MOBILITY TIME-OF-FLIGHT MASS SPECTROMETER WITH BIPOL...
Publication number
20090072133
Publication date
Mar 19, 2009
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
FAST TIME-OF-FLIGHT MASS SPECTROMETER WITH IMPROVED DYNAMIC RANGE
Publication number
20090008545
Publication date
Jan 8, 2009
Ionwerks, Inc.
Katrin Fuhrer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NEUTRAL/ION REACTOR IN ADIABATIC SUPERSONIC GAS FLOW FOR ION MOBILI...
Publication number
20080164409
Publication date
Jul 10, 2008
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
Multi-anode detector with increased dynamic range for time-of-fligh...
Publication number
20070018113
Publication date
Jan 25, 2007
Ionwerks, Inc.
Marc Gonin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multi-beam ion mobility time-of-flight mass spectrometry with multi...
Publication number
20060289746
Publication date
Dec 28, 2006
Valeri V. Raznikov
G01 - MEASURING TESTING
Information
Patent Application
Multi-beam ion mobility time-of-flight mass spectrometer with bipol...
Publication number
20060289747
Publication date
Dec 28, 2006
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
Ion mobility TOF/MALDI/MS using drift cell alternating high and low...
Publication number
20060192104
Publication date
Aug 31, 2006
Ionwerks, Inc.
J. Albert Schultz
G01 - MEASURING TESTING
Information
Patent Application
Fast time-of-flight mass spectrometer with improved data acquisitio...
Publication number
20060192111
Publication date
Aug 31, 2006
Katrin Fuhrer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Gold implantation/deposition of biological samples for laser desorp...
Publication number
20060138317
Publication date
Jun 29, 2006
J. Albert Schultz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multiplex data acquisition modes for ion mobility-mass spectrometry
Publication number
20060024720
Publication date
Feb 2, 2006
John A. McLean
G01 - MEASURING TESTING
Information
Patent Application
MALDI-IM-ortho-TOF mass spectrometry with simultaneous positive and...
Publication number
20050230615
Publication date
Oct 20, 2005
Hiroshi Furutani
G01 - MEASURING TESTING
Information
Patent Application
Gas-phase purification of biomolecules by ion mobility for patterni...
Publication number
20050189485
Publication date
Sep 1, 2005
John A. McLean
C30 - CRYSTAL GROWTH
Information
Patent Application
Ion mobility spectrometer
Publication number
20050189486
Publication date
Sep 1, 2005
Katrin Fuhrer
G01 - MEASURING TESTING