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J. Brian Leen
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Gas sampling instruments and methods
Patent number
11,846,747
Issue date
Dec 19, 2023
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for locating sources of fugitive gas emissions
Patent number
11,768,151
Issue date
Sep 26, 2023
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Grant
Rapid equilibrator for water isotope analysis
Patent number
11,754,478
Issue date
Sep 12, 2023
ABB Schweiz AG
J. Brian Leen
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Systems and methods for skewed basis set fitting
Patent number
11,639,892
Issue date
May 2, 2023
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for efficiently identifying gas leak locations
Patent number
11,619,562
Issue date
Apr 4, 2023
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for locating sources of fugitive gas emissions
Patent number
11,307,137
Issue date
Apr 19, 2022
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Grant
Simultaneous integrated cavity output spectroscopy and ringdown mea...
Patent number
10,782,228
Issue date
Sep 22, 2020
ABB Schweiz AB
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Grant
Long-path infrared spectrometer
Patent number
9,097,583
Issue date
Aug 4, 2015
Los Gatos Research
Manish Gupta
G01 - MEASURING TESTING
Information
Patent Grant
Incoherent cavity ringdown spectroscopy gas analyzer coupled with p...
Patent number
8,654,334
Issue date
Feb 18, 2014
Los Gatos Research
Manish Gupta
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TECHNOLOGIES FOR IMPROVED VISUALIZATION OF GAS LEAK DETECTION DATA
Publication number
20220357231
Publication date
Nov 10, 2022
ABB Schweiz AG
Ajay Nahata
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR SKEWED BASIS SET FITTING
Publication number
20220317029
Publication date
Oct 6, 2022
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR LOCATING SOURCES OF FUGITIVE GAS EMISSIONS
Publication number
20220187199
Publication date
Jun 16, 2022
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Application
TECHNOLOGIES FOR PRODUCING EFFICIENT INVESTIGATION ROUTES FOR IDENT...
Publication number
20220107189
Publication date
Apr 7, 2022
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR EFFICIENTLY IDENTIFYING GAS LEAK LOCATIONS
Publication number
20220107239
Publication date
Apr 7, 2022
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR LOCATING SOURCES OF FUGITIVE GAS EMISSIONS
Publication number
20210156793
Publication date
May 27, 2021
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Application
GAS SAMPLING INSTRUMENTS AND METHODS
Publication number
20210055451
Publication date
Feb 25, 2021
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Application
Rapid Equilibrator for Water Isotope Analysis
Publication number
20200055017
Publication date
Feb 20, 2020
ABB Schweiz AG
J. Brian Leen
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SIMULTANEOUS INTEGRATED CAVITY OUTPUT SPECTROSCOPY AND RINGDOWN MEA...
Publication number
20190128799
Publication date
May 2, 2019
ABB Schweiz AG
J. Brian Leen
G01 - MEASURING TESTING
Information
Patent Application
LONG-PATH INFRARED SPECTROMETER
Publication number
20140319352
Publication date
Oct 30, 2014
LOS GATOS RESEARCH
Manish Gupta
G01 - MEASURING TESTING