J. Christian Swindal

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Ridgefield, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Position measuring apparatus, position measuring method, lithograph...
- Patent number 9,506,743
- Issue date Nov 29, 2016
- ASML Netherlands B.V.
- Arie Jeffrey Den Boef
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical position measuring system and method using a low coherence...
- Patent number 7,573,580
- Issue date Aug 11, 2009
- ASML Holding N.V.
- J. Christian Swindal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POSITION MEASURING APPARATUS, POSITION MEASURING METHOD, LITHOGRAPH...
- Publication number 20150219438
- Publication date Aug 6, 2015
- ASML NETHERLANDS B.V.
- Arie Jeffrey Den Boef
- G01 - MEASURING TESTING
Information Patent Application
Optical position measuring system and method using a low coherence...
- Publication number 20050105100
- Publication date May 19, 2005
- ASML Holding N.V.
- J. Christian Swindal
- G01 - MEASURING TESTING