J. Joseph Armstrong

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Light modulated electron source
- Patent number 11,715,615
- Issue date Aug 1, 2023
- KLA Corporation
- Edgardo Garcia Berrios
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light modulated electron source
- Patent number 11,417,492
- Issue date Aug 16, 2022
- KLA Corporation
- Edgardo Garcia Berrios
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
193nm laser and inspection system
- Patent number 10,439,355
- Issue date Oct 8, 2019
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
183NM laser and inspection system
- Patent number 10,199,149
- Issue date Feb 5, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 10,193,293
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
Laser repetition rate multiplier and flat-top beam profile generato...
- Patent number 10,044,164
- Issue date Aug 7, 2018
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 9,972,959
- Issue date May 15, 2018
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
193nm laser and inspection system
- Patent number 9,935,421
- Issue date Apr 3, 2018
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 9,793,673
- Issue date Oct 17, 2017
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 9,768,577
- Issue date Sep 19, 2017
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
High damage threshold frequency conversion system
- Patent number 9,753,352
- Issue date Sep 5, 2017
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G02 - OPTICS
Information Patent Grant
183NM laser and inspection system
- Patent number 9,748,729
- Issue date Aug 29, 2017
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Grant
193 nm laser and an inspection system using a 193 nm laser
- Patent number 9,608,399
- Issue date Mar 28, 2017
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
193nm laser and inspection system
- Patent number 9,529,182
- Issue date Dec 27, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Grant
Laser repetition rate multiplier and flat-top beam profile generato...
- Patent number 9,525,265
- Issue date Dec 20, 2016
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low stray light beam dump with fiber delivery
- Patent number 9,477,041
- Issue date Oct 25, 2016
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G02 - OPTICS
Information Patent Grant
Laser assembly and inspection system using monolithic bandwidth nar...
- Patent number 9,419,407
- Issue date Aug 16, 2016
- KLA-Tencor Corporation
- Yujun Deng
- G01 - MEASURING TESTING
Information Patent Grant
Multi-stage ramp-up annealing for frequency-conversion crystals
- Patent number 9,413,134
- Issue date Aug 9, 2016
- KLA-Tencor Corporation
- Vladimir Dribinski
- G01 - MEASURING TESTING
Information Patent Grant
External beam delivery system for laser dark-field illumination in...
- Patent number 9,377,610
- Issue date Jun 28, 2016
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G02 - OPTICS
Information Patent Grant
193nm laser and inspection system
- Patent number 9,318,869
- Issue date Apr 19, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Reducing the spectral bandwidth of lasers
- Patent number 9,209,589
- Issue date Dec 8, 2015
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G01 - MEASURING TESTING
Information Patent Grant
High damage threshold frequency conversion system
- Patent number 9,152,008
- Issue date Oct 6, 2015
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G02 - OPTICS
Information Patent Grant
Semiconductor inspection and metrology system using laser pulse mul...
- Patent number 9,151,940
- Issue date Oct 6, 2015
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Laser with high quality, stable output beam, and long life high con...
- Patent number 9,097,683
- Issue date Aug 4, 2015
- KLA-Tencor Corporation
- Vladimir Dribinski
- G01 - MEASURING TESTING
Information Patent Grant
Solid state illumination source and inspection system
- Patent number 9,042,006
- Issue date May 26, 2015
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G01 - MEASURING TESTING
Information Patent Grant
Reducing the spectral bandwidth of lasers
- Patent number 8,964,798
- Issue date Feb 24, 2015
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G01 - MEASURING TESTING
Information Patent Grant
193NM laser and inspection system
- Patent number 8,929,406
- Issue date Jan 6, 2015
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
External beam delivery system using catadioptric objective with asp...
- Patent number 8,896,917
- Issue date Nov 25, 2014
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G02 - OPTICS
Information Patent Grant
Laser with high quality, stable output beam, and long life high con...
- Patent number 8,873,596
- Issue date Oct 28, 2014
- KLA-Tencor Corporation
- Vladimir Dribinski
- G01 - MEASURING TESTING
Information Patent Grant
Measuring crystal site lifetime in a non-linear optical crystal
- Patent number 8,824,514
- Issue date Sep 2, 2014
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Light Modulated Electron Source
- Publication number 20220336180
- Publication date Oct 20, 2022
- KLA Corporation
- Edgardo Garcia Berrios
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT MODULATED ELECTRON SOURCE
- Publication number 20210098222
- Publication date Apr 1, 2021
- KLA Corporation
- Edgardo Garcia Berrios
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20180233872
- Publication date Aug 16, 2018
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
193nm Laser And Inspection System
- Publication number 20180191126
- Publication date Jul 5, 2018
- Yung-Ho Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
183NM Laser And Inspection System
- Publication number 20170323716
- Publication date Nov 9, 2017
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection System Using 193nm Laser
- Publication number 20170229829
- Publication date Aug 10, 2017
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Application
193nm Laser And Inspection System
- Publication number 20170063026
- Publication date Mar 2, 2017
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
Inspection System Using 193nm Laser
- Publication number 20160365693
- Publication date Dec 15, 2016
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Application
Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generato...
- Publication number 20160359292
- Publication date Dec 8, 2016
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20160285223
- Publication date Sep 29, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
183NM Laser And Inspection System
- Publication number 20160099540
- Publication date Apr 7, 2016
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Application
Laser Assembly And Inspection System Using Monolithic Bandwidth Nar...
- Publication number 20160094011
- Publication date Mar 31, 2016
- KLA-Tencor Corporation
- Yujun Deng
- G01 - MEASURING TESTING
Information Patent Application
193nm Laser And An Inspection System Using A 193nm Laser
- Publication number 20160056606
- Publication date Feb 25, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Application
Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generato...
- Publication number 20150372446
- Publication date Dec 24, 2015
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20150364895
- Publication date Dec 17, 2015
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Application
Multi-Stage Ramp-Up Annealing For Frequency-Conversion Crystals
- Publication number 20150299893
- Publication date Oct 22, 2015
- KLA-Tencor Corporation
- Vladimir Dribinski
- C30 - CRYSTAL GROWTH
Information Patent Application
193NM Laser And Inspection System
- Publication number 20150155680
- Publication date Jun 4, 2015
- KLA-Tencor Corporation
- Yung-Ho Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reducing The Spectral Bandwidth Of Lasers
- Publication number 20150139255
- Publication date May 21, 2015
- KLA-Tencor Corporation
- J. Joseph Armstrong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser With High Quality, Stable Output Beam, And Long Life High Con...
- Publication number 20150022805
- Publication date Jan 22, 2015
- KLA-Tencor Corporation
- Vladimir Dribinski
- G01 - MEASURING TESTING
Information Patent Application
193nm Laser And Inspection System
- Publication number 20140226140
- Publication date Aug 14, 2014
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
193NM Laser And Inspection System
- Publication number 20140204963
- Publication date Jul 24, 2014
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20140153596
- Publication date Jun 5, 2014
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Solid State Illumination Source And Inspection System
- Publication number 20140071520
- Publication date Mar 13, 2014
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G01 - MEASURING TESTING
Information Patent Application
Reducing The Spectral Bandwidth Of Lasers
- Publication number 20140016655
- Publication date Jan 16, 2014
- J. Joseph Armstrong
- G01 - MEASURING TESTING
Information Patent Application
Solid-State Laser And Inspection System Using 193nm Laser
- Publication number 20130313440
- Publication date Nov 28, 2013
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Application
Solid-State Laser And Inspection System Using 193nm Laser
- Publication number 20130077086
- Publication date Mar 28, 2013
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
Laser With High Quality, Stable Output Beam, And Long Life High Con...
- Publication number 20130021602
- Publication date Jan 24, 2013
- KLA-Tencor Corporation
- Vladimir Dribinski
- C30 - CRYSTAL GROWTH
Information Patent Application
Semiconductor Inspection And Metrology System Using Laser Pulse Mul...
- Publication number 20120314286
- Publication date Dec 13, 2012
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G02 - OPTICS
Information Patent Application
Enclosure for controlling the environment of optical crystals
- Publication number 20120160856
- Publication date Jun 28, 2012
- J. Joseph Armstrong
- G02 - OPTICS
Information Patent Application
HIGH DAMAGE THRESHOLD FREQUENCY CONVERSION SYSTEM
- Publication number 20120120481
- Publication date May 17, 2012
- KLA-Tencor Corporation
- J. Joseph Armstrong
- G02 - OPTICS

J. Joseph Armstrong

Person

Patents Grantslast 30 patents

Light modulated electron source

Light modulated electron source

193nm laser and inspection system

183NM laser and inspection system

Semiconductor inspection and metrology system using laser pulse mul...

Laser repetition rate multiplier and flat-top beam profile generato...

Semiconductor inspection and metrology system using laser pulse mul...

193nm laser and inspection system

Semiconductor inspection and metrology system using laser pulse mul...

Semiconductor inspection and metrology system using laser pulse mul...

High damage threshold frequency conversion system

183NM laser and inspection system

193 nm laser and an inspection system using a 193 nm laser

193nm laser and inspection system

Laser repetition rate multiplier and flat-top beam profile generato...

Low stray light beam dump with fiber delivery

Laser assembly and inspection system using monolithic bandwidth nar...

Multi-stage ramp-up annealing for frequency-conversion crystals

External beam delivery system for laser dark-field illumination in...

193nm laser and inspection system

Reducing the spectral bandwidth of lasers

High damage threshold frequency conversion system

Semiconductor inspection and metrology system using laser pulse mul...

Laser with high quality, stable output beam, and long life high con...

Solid state illumination source and inspection system

Reducing the spectral bandwidth of lasers

193NM laser and inspection system

External beam delivery system using catadioptric objective with asp...

Laser with high quality, stable output beam, and long life high con...

Measuring crystal site lifetime in a non-linear optical crystal

Patents Applicationslast 30 patents

Light Modulated Electron Source

LIGHT MODULATED ELECTRON SOURCE

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

193nm Laser And Inspection System

183NM Laser And Inspection System

Inspection System Using 193nm Laser

193nm Laser And Inspection System

Inspection System Using 193nm Laser

Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generato...

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

183NM Laser And Inspection System

Laser Assembly And Inspection System Using Monolithic Bandwidth Nar...

193nm Laser And An Inspection System Using A 193nm Laser

Laser Repetition Rate Multiplier And Flat-Top Beam Profile Generato...

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

Multi-Stage Ramp-Up Annealing For Frequency-Conversion Crystals

193NM Laser And Inspection System

Reducing The Spectral Bandwidth Of Lasers

Laser With High Quality, Stable Output Beam, And Long Life High Con...

193nm Laser And Inspection System

193NM Laser And Inspection System

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

Solid State Illumination Source And Inspection System

Reducing The Spectral Bandwidth Of Lasers

Solid-State Laser And Inspection System Using 193nm Laser

Solid-State Laser And Inspection System Using 193nm Laser

Laser With High Quality, Stable Output Beam, And Long Life High Con...

Semiconductor Inspection And Metrology System Using Laser Pulse Mul...

Enclosure for controlling the environment of optical crystals

HIGH DAMAGE THRESHOLD FREQUENCY CONVERSION SYSTEM