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J. Richard Wood
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Grapevine, TX, US
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Patents Grants
last 30 patents
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Patent Grant
X-ray backscatter detection using modulated X-rays
Patent number
9,316,602
Issue date
Apr 19, 2016
Lockheed Martin Corporation
J. Richard Wood
G01 - MEASURING TESTING
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Patent Grant
3D x-ray microscopy imaging system
Patent number
8,411,820
Issue date
Apr 2, 2013
Lockheed Martin Corp.
Mark K. Browder
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
X-RAY BACKSCATTER DETECTION USING MODULATED X-RAYS
Publication number
20140133631
Publication date
May 15, 2014
Lockheed Martin Corporation
J. Richard Wood
G01 - MEASURING TESTING