Jaafar Mejri

Person

Ottobrunn, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit with transformer and corresponding method
- Patent number 11,923,120
- Issue date Mar 5, 2024
- Infineon Technologies AG
- Marcus Nuebling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit containing a transformer and corresponding method
- Patent number 11,841,394
- Issue date Dec 12, 2023
- Infineon Technologies AG
- Marcus Nuebling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Relaxation oscillator and method for operating a relaxation oscillator
- Patent number 10,879,879
- Issue date Dec 29, 2020
- Infineon Technologies AG
- Florian Renneke
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Open pin detection for analog-to-digital converter
- Patent number 10,574,258
- Issue date Feb 25, 2020
- Infineon Technologies AG
- Siegfried Albel
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Three level gate monitoring
- Patent number 10,215,795
- Issue date Feb 26, 2019
- Infineon Technologies AG
- Markus Zannoth
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test for ADC
- Patent number 10,079,610
- Issue date Sep 18, 2018
- Infineon Technologies AG
- Peter Bogner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing a capacitor array by delta charge
- Patent number 9,853,655
- Issue date Dec 26, 2017
- Infineon Technologies AG
- Martin Pernull
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for testing an analog-to-digital converter
- Patent number 9,819,353
- Issue date Nov 14, 2017
- Infineon Technologies AG
- Dario Vagni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built-in-self-test for an analog-to-digital converter
- Patent number 8,970,408
- Issue date Mar 3, 2015
- Infineon Technologies AG
- Peter Bogner
- G01 - MEASURING TESTING
Information Patent Grant
Bandgap reference circuit
- Patent number 7,282,988
- Issue date Oct 16, 2007
- Infineon Technologies AG
- Jaafar Mejri
- G05 - CONTROLLING REGULATING
Information Patent Grant
Transimpedance amplifier
- Patent number 6,756,851
- Issue date Jun 29, 2004
- Infineon Technology AG
- Jaafar Mejri
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
CONTROLLER AND A METHOD TO OPERATE A TEMPERATURE SENSOR
- Publication number 20230228796
- Publication date Jul 20, 2023
- INFINEON TECHNOLOGIES AG
- Chern Sia Phillip Lim
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT WITH TRANSFORMER AND CORRESPONDING METHOD
- Publication number 20210134508
- Publication date May 6, 2021
- INFINEON TECHNOLOGIES AG
- Marcus Nuebling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT CONTAINING A TRANSFORMER AND CORRESPONDING METHOD
- Publication number 20210123970
- Publication date Apr 29, 2021
- INFINEON TECHNOLOGIES AG
- Marcus Nuebling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Relaxation Oscillator and Method for Operating a Relaxation Oscillator
- Publication number 20200162059
- Publication date May 21, 2020
- INFINEON TECHNOLOGIES AG
- Florian Renneke
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF-TEST FOR ADC
- Publication number 20180198460
- Publication date Jul 12, 2018
- INFINEON TECHNOLOGIES AG
- Peter Bogner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR TESTING AN ANALOG-TO-DIGITAL CONVERTER
- Publication number 20170099062
- Publication date Apr 6, 2017
- INFINEON TECHNOLOGIES AG
- Dario Vagni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BUILT-IN-SELF-TEST FOR AN ANALOG-TO-DIGITAL CONVERTER
- Publication number 20150009052
- Publication date Jan 8, 2015
- INFINEON TECHNOLOGIES AG
- Peter BOGNER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR THE ANALYSIS OF A PERIODIC SIGNAL
- Publication number 20100079170
- Publication date Apr 1, 2010
- INFINEON TECHNOLOGIES AG
- Heinz Mattes
- G01 - MEASURING TESTING
Information Patent Application
Bandgap reference circuit
- Publication number 20050225378
- Publication date Oct 13, 2005
- Infineon Technologies AG
- Jaafar Mejri
- G05 - CONTROLLING REGULATING
Information Patent Application
Transimpedance amplifier
- Publication number 20030160659
- Publication date Aug 28, 2003
- Infineon Technologies AG
- Jaafar Mejri
- H03 - BASIC ELECTRONIC CIRCUITRY

Jaafar Mejri

Person

Patents Grantslast 30 patents

Circuit with transformer and corresponding method

Circuit containing a transformer and corresponding method

Relaxation oscillator and method for operating a relaxation oscillator

Open pin detection for analog-to-digital converter

Three level gate monitoring

Built-in self-test for ADC

Testing a capacitor array by delta charge

Apparatus and method for testing an analog-to-digital converter

Built-in-self-test for an analog-to-digital converter

Bandgap reference circuit

Transimpedance amplifier

Patents Applicationslast 30 patents

CONTROLLER AND A METHOD TO OPERATE A TEMPERATURE SENSOR

CIRCUIT WITH TRANSFORMER AND CORRESPONDING METHOD

CIRCUIT CONTAINING A TRANSFORMER AND CORRESPONDING METHOD

Relaxation Oscillator and Method for Operating a Relaxation Oscillator

BUILT-IN SELF-TEST FOR ADC

APPARATUS AND METHOD FOR TESTING AN ANALOG-TO-DIGITAL CONVERTER

BUILT-IN-SELF-TEST FOR AN ANALOG-TO-DIGITAL CONVERTER

APPARATUS AND METHOD FOR THE ANALYSIS OF A PERIODIC SIGNAL

Bandgap reference circuit

Transimpedance amplifier