Jaap Boksem

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Almelo, NL

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Patents Grantslast 30 patents

Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus and method
- Patent number 11,035,805
- Issue date Jun 15, 2021
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 10,900,912
- Issue date Jan 26, 2021
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Object holder for positioning an object in a radiation beam
- Patent number 5,001,351
- Issue date Mar 19, 1991
- U.S. Philips Corporation
- Jaap Boksem
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE MOUNTING SYSTEM FOR AN X-RAY ANALYSIS APPARATUS
- Publication number 20220187224
- Publication date Jun 16, 2022
- MALVERN PANALYTICAL B.V.
- Jaap BOKSEM
- G01 - MEASURING TESTING
Information Patent Application
X-ray Analysis Apparatus
- Publication number 20190317029
- Publication date Oct 17, 2019
- MALVERN PANALYTICAL B.V.
- Detlef BECKERS
- G01 - MEASURING TESTING
Information Patent Application
X-ray Analysis Apparatus and Method
- Publication number 20190317030
- Publication date Oct 17, 2019
- MALVERN PANALYTICAL B.V.
- Detlef BECKERS
- G01 - MEASURING TESTING