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Patents Grantslast 30 patents

Information Patent Grant
Oversamplng and transmitter shooting pattern for light detection an...
- Patent number 11,796,642
- Issue date Oct 24, 2023
- Infineon Technologies AG
- Wojciech Kudla
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and method for light detection and ranging
- Patent number 11,567,175
- Issue date Jan 31, 2023
- Infineon Technologies AG
- Andre Roger
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring of MEMS mirror properties
- Patent number 11,442,265
- Issue date Sep 13, 2022
- Infineon Technologies AG
- Hendrikus Van Lierop
- G02 - OPTICS
Information Patent Grant
Monitoring of MEMS mirror properties
- Patent number 11,073,686
- Issue date Jul 27, 2021
- Infineon Technologies AG
- Hendrikus Van Lierop
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring of MEMS mirror properties
- Patent number 10,788,659
- Issue date Sep 29, 2020
- Infinean Technologies AG
- Hendrikus Van Lierop
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MONITORING OF MEMS MIRROR PROPERTIES
- Publication number 20210311300
- Publication date Oct 7, 2021
- INFINEON TECHNOLOGIES AG
- Hendrikus VAN LIEROP
- G02 - OPTICS
Information Patent Application
MONITORING OF MEMS MIRROR PROPERTIES
- Publication number 20200333585
- Publication date Oct 22, 2020
- INFINEON TECHNOLOGIES AG
- Hendrikus VAN LIEROP
- G01 - MEASURING TESTING
Information Patent Application
OVERSAMPLNG AND TRANSMITTER SHOOTING PATTERN FOR LIGHT DETECTION AN...
- Publication number 20200309917
- Publication date Oct 1, 2020
- INFINEON TECHNOLOGIES AG
- Wojciech KUDLA
- G01 - MEASURING TESTING
Information Patent Application
MONITORING OF MEMS MIRROR PROPERTIES
- Publication number 20200132981
- Publication date Apr 30, 2020
- INFINEON TECHNOLOGIES AG
- Hendrikus VAN LIEROP
- G02 - OPTICS
Information Patent Application
DETECTION SYSTEM WITH CONFIGURABLE RANGE AND FIELD OF VIEW
- Publication number 20190285734
- Publication date Sep 19, 2019
- INFINEON TECHNOLOGIES AG
- Hendrikus VAN LIEROP
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES AND METHOD FOR LIGHT DETECTION AND RANGING
- Publication number 20190101628
- Publication date Apr 4, 2019
- INFINEON TECHNOLOGIES AG
- Andre ROGER
- G01 - MEASURING TESTING