Jack E. Weimer

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Gurnee, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated test equipment for testing high-power electronic components
- Patent number 11,067,629
- Issue date Jul 20, 2021
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Grant
Equi-resistant probe distribution for high-accuracy voltage measure...
- Patent number 11,041,900
- Issue date Jun 22, 2021
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Grant
Current regulation for accurate and low-cost voltage measurements a...
- Patent number 10,698,020
- Issue date Jun 30, 2020
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Grant
Controlling signal path inductance in automatic test equipment
- Patent number 9,989,584
- Issue date Jun 5, 2018
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED TEST EQUIPMENT FOR TESTING HIGH-POWER ELECTRONIC COMPONENTS
- Publication number 20200379043
- Publication date Dec 3, 2020
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING SIGNAL PATH INDUCTANCE IN AUTOMATIC TEST EQUIPMENT
- Publication number 20160011256
- Publication date Jan 14, 2016
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Application
EQUI-RESISTANT PROBE DISTRIBUTION FOR HIGH-ACCURACY VOLTAGE MEASURE...
- Publication number 20150276803
- Publication date Oct 1, 2015
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING
Information Patent Application
CURRENT REGULATION FOR ACCURATE AND LOW-COST VOLTAGE MEASUREMENTS A...
- Publication number 20150276799
- Publication date Oct 1, 2015
- Teradyne, Inc.
- Jack E. Weimer
- G01 - MEASURING TESTING