Jack G. Benning Jr.

Person

  • Lansdale, PA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Two layer probe

    • Patent number 4,511,948
    • Issue date Apr 16, 1985
    • Drexelbrook Controls, Inc.
    • Frederick L. Maltby
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Two layer probe

    • Patent number 4,428,026
    • Issue date Jan 24, 1984
    • Drexelbrook Controls, Inc.
    • Frederick L. Maltby
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method of using capacitor probe with a semiconductive electrode

    • Patent number 4,301,681
    • Issue date Nov 24, 1981
    • Drexelbrook Controls, Inc.
    • Frederick L. Maltby
    • G01 - MEASURING TESTING