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Jack G. Benning Jr.
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Lansdale, PA, US
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last 30 patents
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Patent Grant
Two layer probe
Patent number
4,511,948
Issue date
Apr 16, 1985
Drexelbrook Controls, Inc.
Frederick L. Maltby
G01 - MEASURING TESTING
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Patent Grant
Two layer probe
Patent number
4,428,026
Issue date
Jan 24, 1984
Drexelbrook Controls, Inc.
Frederick L. Maltby
G01 - MEASURING TESTING
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Patent Grant
Method of using capacitor probe with a semiconductive electrode
Patent number
4,301,681
Issue date
Nov 24, 1981
Drexelbrook Controls, Inc.
Frederick L. Maltby
G01 - MEASURING TESTING