Jack T. Dehait

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Dayton, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Half-maximum threshold circuit for optical micrometer
- Patent number 4,097,158
- Issue date Jun 27, 1978
- Systems Research Laboratories, Inc.
- Jack T. Dehait
- G01 - MEASURING TESTING
Information Patent Grant
Calibrated optical micrometer
- Patent number 4,082,463
- Issue date Apr 4, 1978
- Systems Research Laboratories, Inc.
- Jack T. Dehait
- G01 - MEASURING TESTING