Jackson Leung

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Sugar Land, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Current controlled multi-state parallel test for semiconductor device
- Patent number 6,615,391
- Issue date Sep 2, 2003
- Texas Instruments Incorporated
- Brian L. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Two pass multi-state parallel test for semiconductor device
- Patent number 6,408,411
- Issue date Jun 18, 2002
- Texas Instruments Incorporated
- Brian L. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Current controlled multi-state parallel test for semiconductor device
- Patent number 6,381,718
- Issue date Apr 30, 2002
- Texas Instruments Incorporated
- Brian L. Brown
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Current controlled multi-state parallel test for semiconductor device
- Publication number 20020080668
- Publication date Jun 27, 2002
- Brian L. Brown
- H01 - BASIC ELECTRIC ELEMENTS