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Jacob A. Abraham
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Champaign, IL, US
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for testing a system-on-a-chip
Patent number
6,964,004
Issue date
Nov 8, 2005
Ardext Technologies, Inc.
Abhijit Chatterjee
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating three-dimensional microstructures and a high...
Patent number
4,948,757
Issue date
Aug 14, 1990
General Motors Corporation
Kailash C. Jain
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabricating three-dimensional microstructures and a high...
Patent number
4,918,032
Issue date
Apr 17, 1990
General Motors Corporation
Kailash C. Jain
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MICROWAVE OVEN WITH ANTENNA ARRAY
Publication number
20130175262
Publication date
Jul 11, 2013
Ranjit Gharpurey
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
CONTROL FLOW DEVIATION DETECTION FOR SOFTWARE SECURITY
Publication number
20090328211
Publication date
Dec 31, 2009
Jacob A. Abraham
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PERFORMING ANALOG-TO-DIGITAL CONVERSION BY COMPUTING DELAY TIME BET...
Publication number
20090295613
Publication date
Dec 3, 2009
Board of Regents, The University of Texas System
Arjang Hassibi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Circuit modeling apparatus, systems, and methods
Publication number
20050193304
Publication date
Sep 1, 2005
Board of Regents, The University of Texas System
Jacob Abraham
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for testing a system-on-a-chip
Publication number
20030158688
Publication date
Aug 21, 2003
Abhijit Chatterjee
G01 - MEASURING TESTING