Jacob Chee Hong Phang

Person

Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for cooling a semiconductor device
- Patent number 8,891,240
- Issue date Nov 18, 2014
- Semicaps Pte Ltd.
- Choon Meng Chua
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Rotational stage for high speed, large area scanning in focused bea...
- Patent number RE43757
- Issue date Oct 23, 2012
- National University of Singapore
- Yong Yu Liu
- 250 - Radiant energy
Information Patent Grant
Rotational stage for high speed, large area scanning in focused bea...
- Patent number 6,911,656
- Issue date Jun 28, 2005
- National University of Singapore
- Yong Yu Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser beam induced phenomena detection
- Patent number 6,897,664
- Issue date May 24, 2005
- Advanced Micro Devices, Inc.
- Michael Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Rotational stage for high speed, large area scanning in focused bea...
- Patent number 6,777,688
- Issue date Aug 17, 2004
- National University of Singapore
- Yong Yu Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective deposition of a particle beam based on charging character...
- Patent number 6,608,305
- Issue date Aug 19, 2003
- National University of Singapore
- Wong Wai Kin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed single contact optical beam induced current analysis of inte...
- Patent number 6,556,029
- Issue date Apr 29, 2003
- National University of Singapore
- Chin Jiann Min
- G01 - MEASURING TESTING
Information Patent Grant
Portable high resolution scanning electron microscope column using...
- Patent number 6,320,194
- Issue date Nov 20, 2001
- Institute of Materials Research and Engineering
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Portable high resolution scanning electron microscope column using...
- Patent number 6,057,553
- Issue date May 2, 2000
- Institute of Materials Research & Engineering
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated emission microscope for panchromatic imaging, continuous...
- Patent number 5,724,131
- Issue date Mar 3, 1998
- The National University of Singapore
- Wai Kin Chim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring quantitative voltage contrast
- Patent number 5,486,769
- Issue date Jan 23, 1996
- National University of Singapore
- Wai K. Chim
- G01 - MEASURING TESTING
Information Patent Grant
Double reflection cathodoluminescence detector with extremely high...
- Patent number 5,468,967
- Issue date Nov 21, 1995
- National University of Singapore
- Daniel S. H. Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High efficiency cathodoluminescence detector with high discriminati...
- Patent number 5,264,704
- Issue date Nov 23, 1993
- National University of Singapore
- Jacob C. H. Phang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and system for measuring laser induced phenomena changes in...
- Publication number 20060284625
- Publication date Dec 21, 2006
- SEMICAPS Pte Ltd
- Choon Meng Chua
- G01 - MEASURING TESTING
Information Patent Application
Rotational stage for high speed, large area scanning in focused bea...
- Publication number 20040251425
- Publication date Dec 16, 2004
- Yong Yu Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Rotational stage for high speed, large area scanning in focused bea...
- Publication number 20040051049
- Publication date Mar 18, 2004
- Yong Yu Liu
- H01 - BASIC ELECTRIC ELEMENTS

Jacob Chee Hong Phang

Person

Patents Grantslast 30 patents

Apparatus and method for cooling a semiconductor device

Rotational stage for high speed, large area scanning in focused bea...

Rotational stage for high speed, large area scanning in focused bea...

Laser beam induced phenomena detection

Rotational stage for high speed, large area scanning in focused bea...

Selective deposition of a particle beam based on charging character...

Pulsed single contact optical beam induced current analysis of inte...

Portable high resolution scanning electron microscope column using...

Portable high resolution scanning electron microscope column using...

Integrated emission microscope for panchromatic imaging, continuous...

Method and apparatus for measuring quantitative voltage contrast

Double reflection cathodoluminescence detector with extremely high...

High efficiency cathodoluminescence detector with high discriminati...

Patents Applicationslast 30 patents

Method and system for measuring laser induced phenomena changes in...

Rotational stage for high speed, large area scanning in focused bea...

Rotational stage for high speed, large area scanning in focused bea...