Jacob Joseph Orbon, JR.

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Morgan Hill, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Design-based method for grouping systematic defects in lithography...
- Patent number 7,760,347
- Issue date Jul 20, 2010
- Applied Materials, Inc.
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Design-based monitoring
- Patent number 7,135,344
- Issue date Nov 14, 2006
- Applied Materials, Israel, Ltd.
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DESIGN-BASED MONITORING
- Publication number 20090007030
- Publication date Jan 1, 2009
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY