Jacob Joseph Orbon JR.

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Morgan Hill, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for operating a secure semiconductor IP server to support fa...
- Patent number 8,060,851
- Issue date Nov 15, 2011
- Verigy (Singapore) Pte. Ltd.
- Richard C. Dokken
- G01 - MEASURING TESTING
Information Patent Grant
Grouping systematic defects with feedback from electrical inspection
- Patent number 7,760,929
- Issue date Jul 20, 2010
- Applied Materials, Inc.
- Jacob J. Orbon
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OPERATING A SECURE SEMICONDUCTOR IP SERVER TO SUPPORT FA...
- Publication number 20100031092
- Publication date Feb 4, 2010
- Inovys Corporation
- RICHARD C. DOKKEN
- G01 - MEASURING TESTING
Information Patent Application
GROUPING SYSTEMATIC DEFECTS WITH FEEDBACK FROM ELECTRICAL INSPECTION
- Publication number 20070052963
- Publication date Mar 8, 2007
- JACOB J. ORBON
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Design-based monitoring
- Publication number 20050010890
- Publication date Jan 13, 2005
- Applied Materials Israel Ltd.
- Youval Nehmadi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY