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Jacob Karin
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Ramat Gan, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Scanning mechanism for high-speed high-resolution scanning
Patent number
7,037,012
Issue date
May 2, 2006
Ziv-Av Engineering Ltd.
Jacob Karin
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Auto-focus method for a scanning microscope
Patent number
6,824,056
Issue date
Nov 30, 2004
Accretech (Israel) Ltd.
Jacob Karin
G02 - OPTICS
Information
Patent Grant
Cartesian scanning system
Patent number
6,735,005
Issue date
May 11, 2004
Tokyo Seimitso (Israel) Ltd.
Jacob Karin
G02 - OPTICS
Information
Patent Grant
Circular scanning patterns
Patent number
6,603,589
Issue date
Aug 5, 2003
Tokyo Seimitsu (Israel) Ltd.
Jacob Karin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Electron microscope array for inspection and lithography
Publication number
20060033035
Publication date
Feb 16, 2006
Mordechai Itzkovitch
B82 - NANO-TECHNOLOGY
Information
Patent Application
Confocal microscopy arrangement without beam splitter
Publication number
20050111082
Publication date
May 26, 2005
ACCRETECH (ISRAEL) LTD
Jacob Karin
G02 - OPTICS
Information
Patent Application
Scanning mechanism for high-speed high-resolution scanning
Publication number
20040165923
Publication date
Aug 26, 2004
ACCRETECH (ISRAEL) LTD
Jacob Karin
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
Image sensor for confocal microscopy
Publication number
20040140417
Publication date
Jul 22, 2004
ACCRETECH (ISRAEL) LTD
Jacob Karin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Multiple scanning system and method
Publication number
20040075879
Publication date
Apr 22, 2004
ACCRETECH (ISRAEL) LTD
Jacob Karin
G02 - OPTICS
Information
Patent Application
Confocal microscope with diffractively formed virtual pinhole array
Publication number
20040051976
Publication date
Mar 18, 2004
ACCRETECH (ISRAEL) LTD
Jacob Karin
G02 - OPTICS
Information
Patent Application
Circular scanning patterns
Publication number
20030099022
Publication date
May 29, 2003
Tokyo Seimitsu (Israel) Ltd.
Jacob Karin
G01 - MEASURING TESTING
Information
Patent Application
Cartesian scanning system
Publication number
20030090772
Publication date
May 15, 2003
Tokyo Seimitsu (Israel) Ltd.
Jacob Karin
G02 - OPTICS
Information
Patent Application
Tilted scan for Die-to-Die and Cell-to-Cell detection
Publication number
20030081826
Publication date
May 1, 2003
Tokyo Seimitsu (Israel) Ltd.
Jacob Karin
G06 - COMPUTING CALCULATING COUNTING