Jacob Levin

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Sensor for electron detection
- Patent number 11,355,309
- Issue date Jun 7, 2022
- Applied Materials Israel Ltd.
- Itay Assulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam source and a method for assembling a charged...
- Patent number 11,189,451
- Issue date Nov 30, 2021
- Applied Materials Israel Ltd.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam source and a method for assembling a charged...
- Patent number 10,886,092
- Issue date Jan 5, 2021
- Applied Materials Israel Ltd.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for inspecting and reviewing a sample
- Patent number 10,177,048
- Issue date Jan 8, 2019
- Applied Materials Israel Ltd.
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and method for operating a charged...
- Patent number 7,838,830
- Issue date Nov 23, 2010
- ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating and reviewing a thin sample
- Patent number 7,659,506
- Issue date Feb 9, 2010
- Applied Materials, Israel, Ltd.
- Michal Avinun-Kalish
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT
- Publication number 20240057957
- Publication date Feb 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Martin Chauvin
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DETECTING BACKSCATTERED ELECTRONS IN A MULTI-BEAM CHARGED PARTICLE...
- Publication number 20210341398
- Publication date Nov 4, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Jacob Levin
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FOR ELECTRON DETECTION
- Publication number 20210319976
- Publication date Oct 14, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Itay Assulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SOURCE AND A METHOD FOR ASSEMBLING A CHARGED...
- Publication number 20210175040
- Publication date Jun 10, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SOURCE AND A METHOD FOR ASSEMBLING A CHARGED...
- Publication number 20200234907
- Publication date Jul 23, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR INSPECTING AND REVIEWING A SAMPLE
- Publication number 20160260642
- Publication date Sep 8, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING AND REVIEWING A THIN SAMPLE
- Publication number 20090078867
- Publication date Mar 26, 2009
- Michal Avinun-Kalish
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A CHARGED...
- Publication number 20080258060
- Publication date Oct 23, 2008
- JUERGEN FROSIEN
- H01 - BASIC ELECTRIC ELEMENTS

Jacob Levin

Person

Patents Grantslast 30 patents

Sensor for electron detection

Charged particle beam source and a method for assembling a charged...

Charged particle beam source and a method for assembling a charged...

System for inspecting and reviewing a sample

Charged particle beam apparatus and method for operating a charged...

Method and system for generating and reviewing a thin sample

Patents Applicationslast 30 patents

ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT

DETECTING BACKSCATTERED ELECTRONS IN A MULTI-BEAM CHARGED PARTICLE...

SENSOR FOR ELECTRON DETECTION

CHARGED PARTICLE BEAM SOURCE AND A METHOD FOR ASSEMBLING A CHARGED...

CHARGED PARTICLE BEAM SOURCE AND A METHOD FOR ASSEMBLING A CHARGED...

SYSTEM FOR INSPECTING AND REVIEWING A SAMPLE

METHOD AND SYSTEM FOR GENERATING AND REVIEWING A THIN SAMPLE

CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A CHARGED...