Jacob Pieter Hoogenboom

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Delft, NL

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Patents Grantslast 30 patents

Information Patent Grant
Integrated optical and charged particle inspection apparatus
- Patent number 11,742,173
- Issue date Aug 29, 2023
- DELMIC IP B.V.
- Sander Den Hoedt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting a sample using an assembly comprising a scann...
- Patent number 10,651,009
- Issue date May 12, 2020
- DELMIC IP B.V.
- Jacob Pieter Hoogenboom
- G02 - OPTICS
Information Patent Grant
Method and apparatus for determining a density of fluorescent marke...
- Patent number 10,132,753
- Issue date Nov 20, 2018
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated optical and charged particle inspection apparatus
- Patent number 9,715,992
- Issue date Jul 25, 2017
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated optical and charged particle inspection apparatus
- Patent number 9,378,921
- Issue date Jun 28, 2016
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and replaceable door for a vacuum chamber of s...
- Patent number 8,895,921
- Issue date Nov 25, 2014
- Delmic B.V.
- Pieter Kruit
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS
- Publication number 20220172921
- Publication date Jun 2, 2022
- DELMIC IP B.V.
- Sander DEN HOEDT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for inspecting a sample using an assembly comprising a scann...
- Publication number 20170221675
- Publication date Aug 3, 2017
- DELMIC B.V.
- Jacob Pieter HOOGENBOOM
- G02 - OPTICS
Information Patent Application
INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS
- Publication number 20150262784
- Publication date Sep 17, 2015
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED OPTICAL AND CHARGED PARTICLE INSPECTION APPARATUS
- Publication number 20150108350
- Publication date Apr 23, 2015
- DELMIC B.V.
- Jacob Pieter Hoogenboom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND REPLACEABLE DOOR FOR A VACUUM CHAMBER OF S...
- Publication number 20130200262
- Publication date Aug 8, 2013
- DELMIC B.V.
- Pieter Kruit
- G01 - MEASURING TESTING