JACOB SIMON FABER

Person

EINDHOVEN, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Contactless temperature measurement in a charged particle microscope
- Patent number 10,134,563
- Issue date Nov 20, 2018
- FEI Company
- Jacob Simon Faber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive scanning for particle size using directed beam signal anal...
- Patent number 9,502,211
- Issue date Nov 22, 2016
- FEI Company
- Cornelis Sander Kooijman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming microscopic 3D structures
- Patent number 8,597,565
- Issue date Dec 3, 2013
- FEI Company
- Jacob Simon Faber
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Forming an image while milling a work piece
- Patent number 8,399,831
- Issue date Mar 19, 2013
- FEI Company
- Jacob Simon Faber
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle instrument equipped with optical microscope
- Patent number 7,675,034
- Issue date Mar 9, 2010
- FEI Company
- Jacob Simon Faber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of adjusting the operating region of a tool component to a p...
- Patent number 7,362,452
- Issue date Apr 22, 2008
- FEI Company
- Jacob Simon Faber
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods and Systems for Processing of Microscopy Images
- Publication number 20230179885
- Publication date Jun 8, 2023
- FEI Company
- Jeroen KEIZER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE SCANNING FOR PARTICLE SIZE USING DIRECTED BEAM SIGNAL ANAL...
- Publication number 20160322194
- Publication date Nov 3, 2016
- FEI Company
- Cornelis Sander Kooijman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACTLESS TEMPERATURE MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE
- Publication number 20160133436
- Publication date May 12, 2016
- FEI Company
- Jacob Simon Faber
- G01 - MEASURING TESTING
Information Patent Application
Imaging a Sample with Multiple Beams and Multiple Detectors
- Publication number 20150279615
- Publication date Oct 1, 2015
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Forming Microscopic 3D Structures
- Publication number 20100255213
- Publication date Oct 7, 2010
- FEI Company
- Jacob Simon Faber
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
FORMING AN IMAGE WHILE MILLING A WORK PIECE
- Publication number 20100243889
- Publication date Sep 30, 2010
- FEI Company
- JACOB SIMON FABER
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Instrument Equipped with Optical Microscope
- Publication number 20080296499
- Publication date Dec 4, 2008
- FEI Company
- JACOB SIMON FABER
- G02 - OPTICS
Information Patent Application
Method of adjusting the operating region of a tool component to a p...
- Publication number 20070075271
- Publication date Apr 5, 2007
- FEI Company
- Jacob Simon Faber
- H01 - BASIC ELECTRIC ELEMENTS

JACOB SIMON FABER

Person

Patents Grantslast 30 patents

Contactless temperature measurement in a charged particle microscope

Adaptive scanning for particle size using directed beam signal anal...

Method for forming microscopic 3D structures

Forming an image while milling a work piece

Charged particle instrument equipped with optical microscope

Method of adjusting the operating region of a tool component to a p...

Patents Applicationslast 30 patents

Methods and Systems for Processing of Microscopy Images

ADAPTIVE SCANNING FOR PARTICLE SIZE USING DIRECTED BEAM SIGNAL ANAL...

CONTACTLESS TEMPERATURE MEASUREMENT IN A CHARGED PARTICLE MICROSCOPE

Imaging a Sample with Multiple Beams and Multiple Detectors

Method for Forming Microscopic 3D Structures

FORMING AN IMAGE WHILE MILLING A WORK PIECE

Charged Particle Instrument Equipped with Optical Microscope

Method of adjusting the operating region of a tool component to a p...