Jacques Goldberg

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Haifa, IL

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for high-Z threat alarm resolution
- Patent number 9,625,606
- Issue date Apr 18, 2017
- Rapiscan Systems, Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for high-Z threat alarm resolution
- Patent number 9,310,323
- Issue date Apr 12, 2016
- Rapiscan Systems, Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Detection of high Z materials using reference database
- Patent number 8,143,575
- Issue date Mar 27, 2012
- CeLight, Inc.
- Jacques Goldberg
- G01 - MEASURING TESTING
Information Patent Grant
System and method for high Z material detection
- Patent number 7,897,925
- Issue date Mar 1, 2011
- CeLight, Inc.
- Jacques Goldberg
- G01 - MEASURING TESTING
Information Patent Grant
High Z material detection system and method
- Patent number 7,470,905
- Issue date Dec 30, 2008
- CeLight, Inc.
- Jacques Goldberg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Systems and Methods for High-Z Threat Alarm Resolution
- Publication number 20160216398
- Publication date Jul 28, 2016
- Rapiscan Systems, Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for High-Z Threat Alarm Resolution
- Publication number 20150108349
- Publication date Apr 23, 2015
- Rapiscan Systems, Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF HIGH Z MATERIALS USING REFERENCE DATABASE
- Publication number 20100065745
- Publication date Mar 18, 2010
- CeLight, Inc.
- Jacques Goldberg
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR HIGH Z MATERIAL DETECTION
- Publication number 20090224157
- Publication date Sep 10, 2009
- CeLight, Inc.
- Jacques Goldberg
- G01 - MEASURING TESTING