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Jae Cho
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Saratoga, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for self-regulated burn-in of an integrated ci...
Patent number
8,212,576
Issue date
Jul 3, 2012
Xilinx, Inc.
Jae Cho
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor component having test pads and method and apparatus f...
Patent number
7,737,439
Issue date
Jun 15, 2010
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor component having test pads and method and apparatus f...
Patent number
7,235,412
Issue date
Jun 26, 2007
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Application-specific testing methods for programmable logic devices
Patent number
6,891,395
Issue date
May 10, 2005
Xilinx, Inc.
Robert W. Wells
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Application-specific testing methods for programmable logic devices
Patent number
6,817,006
Issue date
Nov 9, 2004
Xilinx, Inc.
Robert W. Wells
G01 - MEASURING TESTING
Information
Patent Grant
Method of using partially defective programmable logic devices
Patent number
6,664,808
Issue date
Dec 16, 2003
Xilinx, Inc.
Zhi-Min Ling
G01 - MEASURING TESTING
Information
Patent Grant
Methods and circuits for precise edge placement of test signals
Patent number
6,594,797
Issue date
Jul 15, 2003
Xilinx, Inc.
Rick W. Dudley
G01 - MEASURING TESTING
Information
Patent Grant
Methods and structures for protecting reticles from ESD failure
Patent number
6,376,131
Issue date
Apr 23, 2002
Xilinx, Inc.
Jae Cho
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor component having test pads and method and apparatus f...
Publication number
20070221920
Publication date
Sep 27, 2007
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Semiconductor component having test pads and method and apparatus f...
Publication number
20070218573
Publication date
Sep 20, 2007
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Application-specific testing methods for programmable logic devices
Publication number
20040216081
Publication date
Oct 28, 2004
Xilinx, Inc.
Robert W. Wells
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of using partially defective programmable logic devices
Publication number
20030062923
Publication date
Apr 3, 2003
Xilinx, Inc.
Zhi-Min Ling
G01 - MEASURING TESTING