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Jae-Heun Woo
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Daejeon, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Distance measuring apparatus and method of operating the same
Patent number
11,378,665
Issue date
Jul 5, 2022
Korea Research Institute of Standards and Science
Jae-Wan Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Absolute position measuring method, absolute position measuring app...
Patent number
10,801,864
Issue date
Oct 13, 2020
Korea Research Institute of Standards and Science
Jong-Ahn Kim
G01 - MEASURING TESTING
Information
Patent Grant
Thickness measuring apparatus and thickness measuring method
Patent number
9,927,224
Issue date
Mar 27, 2018
Korea Research Institute of Standards and Science
Jong-Ahn Kim
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
CURRENT COLLECTOR, BATTERY CELL, BATTERY PACK, AND VEHICLE INCLUDIN...
Publication number
20240421451
Publication date
Dec 19, 2024
LG ENERGY SOLUTION, LTD.
Sang-Jin PARK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEPARATOR, ELECTRODE ASSEMBLY, CYLINDRICAL BATTERY CELL, AND BATTER...
Publication number
20240396168
Publication date
Nov 28, 2024
LG ENERGY SOLUTION, LTD.
Jae-Young WOO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRODE ASSEMBLY AND SECONDARY BATTERY COMPRISING SAME
Publication number
20240162451
Publication date
May 16, 2024
LG ENERGY SOLUTION, LTD.
Inbok PARK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRODE ASSEMBLY, CYLINDRICAL BATTERY CELL, AND BATTERY PACK AND...
Publication number
20230118382
Publication date
Apr 20, 2023
LG ENERGY SOLUTION, LTD.
Myung-An LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ABSOLUTE POSITION MEASURING METHOD, ABSOLUTE POSITION MEASURING APP...
Publication number
20190250013
Publication date
Aug 15, 2019
Korea Research Institute of Standards and Science
Jong-Ahn KIM
G01 - MEASURING TESTING
Information
Patent Application
Distance Measuring Apparatus and Method of Operating the Same
Publication number
20190162852
Publication date
May 30, 2019
Korea Research Institute of Standards and Science
Jae-Wan KIM
G01 - MEASURING TESTING
Information
Patent Application
THICKNESS MEASURING APPARATUS AND THICKNESS MEASURING METHOD
Publication number
20160202038
Publication date
Jul 14, 2016
Korea Research Institute of Standards and Science
Jong-Ahn Kim
G01 - MEASURING TESTING