Jae Mok Yi

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Gyeongsangbuk-Do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of bright-field imaging using X-rays
- Patent number 7,903,785
- Issue date Mar 8, 2011
- Postech Foundation
- Jung Ho Je
- G01 - MEASURING TESTING
Information Patent Grant
Characterization of three-dimensional distribution of defects by X-...
- Patent number 7,620,149
- Issue date Nov 17, 2009
- Postech Foundation
- Jung Ho Je
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF BRIGHT-FIELD IMAGING USING X-RAYS
- Publication number 20090290681
- Publication date Nov 26, 2009
- Jung Ho Je
- G01 - MEASURING TESTING
Information Patent Application
Characterization of Three-Dimensional Distribution of Defects by X-...
- Publication number 20090034681
- Publication date Feb 5, 2009
- POSTECH FOUNDATION
- Jung Ho Je
- G01 - MEASURING TESTING