Jae Seok KANG

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Icheon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Memory chip and test system including the same
- Patent number 10,916,325
- Issue date Feb 9, 2021
- SK Hynix Inc.
- Jae Seok Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory apparatus
- Patent number 10,643,731
- Issue date May 5, 2020
- SK hynix Inc.
- Jae Seok Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory apparatus and test method thereof
- Patent number 10,176,885
- Issue date Jan 8, 2019
- SK hynix Inc.
- Jae Seok Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Electronic device and operating method thereof
- Patent number 10,042,588
- Issue date Aug 7, 2018
- SK hynix Inc.
- Jae-Yong Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method of generating test pattern, test system using...
- Patent number 9,933,486
- Issue date Apr 3, 2018
- SK hynix Inc.
- Jae Seok Kang
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing array fuse of semiconductor apparatus
- Patent number 9,543,043
- Issue date Jan 10, 2017
- SK hynix Inc.
- Jae Seok Kang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY CHIP AND TEST SYSTEM INCLUDING THE SAME
- Publication number 20190279734
- Publication date Sep 12, 2019
- SK HYNIX INC.
- Jae Seok KANG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY APPARATUS
- Publication number 20190164622
- Publication date May 30, 2019
- SK HYNIX INC.
- Jae Seok KANG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD THEREOF
- Publication number 20180286493
- Publication date Oct 4, 2018
- SK HYNIX INC.
- Jae Seok KANG
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC DEVICE AND OPERATING METHOD THEREOF
- Publication number 20180018134
- Publication date Jan 18, 2018
- SK HYNIX INC.
- Jae-Yong Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD OF GENERATING TEST PATTERN, TEST SYSTEM USING...
- Publication number 20160356848
- Publication date Dec 8, 2016
- SK HYNIX INC.
- Jae Seok KANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING ARRAY FUSE OF SEMICONDUCTOR APPARATUS
- Publication number 20160012917
- Publication date Jan 14, 2016
- SK HYNIX INC.
- Jae Seok KANG
- G11 - INFORMATION STORAGE