Jae Suk HWANG

Follow

Person

Berkeley, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Contact and test socket device for testing semiconductor device
- Patent number 11,486,896
- Issue date Nov 1, 2022
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Contact and test socket device for testing semiconductor device
- Patent number 11,486,897
- Issue date Nov 1, 2022
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Contact and test socket device for testing semiconductor device
- Patent number 10,935,572
- Issue date Mar 2, 2021
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Contact for testing semiconductor device, and test socket device th...
- Patent number 10,761,110
- Issue date Sep 1, 2020
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Socket apparatus for semiconductor device test
- Patent number 10,241,132
- Issue date Mar 26, 2019
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact
- Patent number 10,094,852
- Issue date Oct 9, 2018
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Socket device for testing semiconductor device
- Patent number 9,494,616
- Issue date Nov 15, 2016
- HICON CO., LTD.
- Dong Weon Hwang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT AND TEST SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20210148950
- Publication date May 20, 2021
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Application
CONTACT AND TEST SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20210140997
- Publication date May 13, 2021
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Application
CONTACT FOR TESTING SEMICONDUCTOR DEVICE, AND TEST SOCKET DEVICE TH...
- Publication number 20190317128
- Publication date Oct 17, 2019
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Application
CONTACT AND TEST SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20180348256
- Publication date Dec 6, 2018
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Application
SOCKET APPARATUS FOR SEMICONDUCTOR DEVICE TEST
- Publication number 20170045551
- Publication date Feb 16, 2017
- HICON CO., LTD
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
SOCKET DEVICE FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20150377924
- Publication date Dec 31, 2015
- HICON CO., LTD.
- Dong Weon HWANG
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT
- Publication number 20150377925
- Publication date Dec 31, 2015
- HICON CO., LTD.
- Dong Weon HWANG
- G01 - MEASURING TESTING