Jaehyung Ahn

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Accelerator, method of operating the accelerator, and device includ...
- Patent number 12,086,599
- Issue date Sep 10, 2024
- Samsung Electronics Co., Ltd.
- Jaehyung Ahn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus with cosmic ray fault protection
- Patent number 12,056,004
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Byungwoo Bang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device and method with on-demand accelerator checkpointing
- Patent number 12,019,520
- Issue date Jun 25, 2024
- Samsung Electronics Co., Ltd.
- Jaehyung Ahn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus with accelerator
- Patent number 12,014,202
- Issue date Jun 18, 2024
- Samsung Electronics Co., Ltd.
- Jaehyung Ahn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Active scheduling method and computing apparatus
- Patent number 12,014,215
- Issue date Jun 18, 2024
- Samsung Electronics Co., Ltd.
- Jieun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting semiconductor wafer, an inspection system for...
- Patent number 10,269,111
- Issue date Apr 23, 2019
- Samsung Electronics Co., Ltd.
- Joonseo Song
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CRITICAL DIMENSION PREDICTION SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20240332093
- Publication date Oct 3, 2024
- Samsung Electronics Co., Ltd.
- In Seok PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF
- Publication number 20240248051
- Publication date Jul 25, 2024
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD WITH ON-DEMAND ACCELERATOR CHECKPOINTING
- Publication number 20230281081
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- Jaehyung Ahn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD O...
- Publication number 20230140892
- Publication date May 11, 2023
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS WITH COSMIC RAY FAULT PROTECTION
- Publication number 20230076106
- Publication date Mar 9, 2023
- Samsung Electronics Co., Ltd.
- BYUNGWOO BANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELERATOR, METHOD OF OPERATING THE ACCELERATOR, AND DEVICE INCLUD...
- Publication number 20220229668
- Publication date Jul 21, 2022
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE SCHEDULING METHOD AND COMPUTING APPARATUS
- Publication number 20220171658
- Publication date Jun 2, 2022
- Samsung Electronics Co., Ltd.
- Jieun LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING METHOD AND APPARATUS
- Publication number 20220121912
- Publication date Apr 21, 2022
- Samsung Electronics Co., Ltd.
- Hyesun HONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS WITH ACCELERATOR
- Publication number 20210256373
- Publication date Aug 19, 2021
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELERATOR, METHOD OF OPERATING THE ACCELERATOR, AND DEVICE INCLUD...
- Publication number 20210191728
- Publication date Jun 24, 2021
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR...
- Publication number 20180053292
- Publication date Feb 22, 2018
- Samsung Electronics Co., Ltd.
- Joonseo Song
- G06 - COMPUTING CALCULATING COUNTING

Jaehyung Ahn

Person

Patents Grantslast 30 patents

Accelerator, method of operating the accelerator, and device includ...

Method and apparatus with cosmic ray fault protection

Electronic device and method with on-demand accelerator checkpointing

Method and apparatus with accelerator

Active scheduling method and computing apparatus

Method of inspecting semiconductor wafer, an inspection system for...

Patents Applicationslast 30 patents

CRITICAL DIMENSION PREDICTION SYSTEM AND OPERATION METHOD THEREOF

WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF

ELECTRONIC DEVICE AND METHOD WITH ON-DEMAND ACCELERATOR CHECKPOINTING

METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD O...

METHOD AND APPARATUS WITH COSMIC RAY FAULT PROTECTION

ACCELERATOR, METHOD OF OPERATING THE ACCELERATOR, AND DEVICE INCLUD...

ACTIVE SCHEDULING METHOD AND COMPUTING APPARATUS

DATA PROCESSING METHOD AND APPARATUS

METHOD AND APPARATUS WITH ACCELERATOR

ACCELERATOR, METHOD OF OPERATING THE ACCELERATOR, AND DEVICE INCLUD...

METHOD OF INSPECTING SEMICONDUCTOR WAFER, AN INSPECTION SYSTEM FOR...