Jaemoo CHOI

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Interface board for testing image sensor, test system having the sa...
- Patent number 12,328,424
- Issue date Jun 10, 2025
- Samsung Electronics Co., Ltd.
- Shinki Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor test system including operational amplifier and low-fr...
- Patent number 12,309,353
- Issue date May 20, 2025
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wafer-level multi-device tester and system including the same preli...
- Patent number 12,105,146
- Issue date Oct 1, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Grant
Teaching apparatus and substrate alignment apparatus using the same
- Patent number 12,074,051
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Taehyoung Lee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD INCLUDING POWER COMPENSATION CIRCUIT AND TEST SYSTEM INC...
- Publication number 20250138088
- Publication date May 1, 2025
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20250123323
- Publication date Apr 17, 2025
- Samsung Electronics Co., Ltd.
- Haewook PARK
- G01 - MEASURING TESTING
Information Patent Application
RECEIVING CIRCUIT IN TEST DEVICE, TEST SYSTEM HAVING THE SAME, AND...
- Publication number 20250076381
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Seongkwan LEE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST DEVICES, SYSTEMS INCLUDING THE SAME, AND METHODS...
- Publication number 20240319265
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan LEE
- G01 - MEASURING TESTING
Information Patent Application
WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME
- Publication number 20240085478
- Publication date Mar 14, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF
- Publication number 20240053391
- Publication date Feb 15, 2024
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR TEST SYSTEM
- Publication number 20230362350
- Publication date Nov 9, 2023
- Samsung Electronics Co., Ltd.
- Seongkwan Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEACHING APPARATUS AND SUBSTRATE ALIGNMENT APPARATUS USING THE SAME
- Publication number 20230064941
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Taehyoung LEE
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
INTERFACE BOARD FOR TESTING IMAGE SENSOR, TEST SYSTEM HAVING THE SA...
- Publication number 20230047664
- Publication date Feb 16, 2023
- Samsung Electronics Co., Ltd.
- Shinki JEONG
- H01 - BASIC ELECTRIC ELEMENTS

Jaemoo CHOI

Person

Patents Grantslast 30 patents

Interface board for testing image sensor, test system having the sa...

Image sensor test system including operational amplifier and low-fr...

Wafer-level multi-device tester and system including the same preli...

Teaching apparatus and substrate alignment apparatus using the same

Patents Applicationslast 30 patents

PROBE CARD INCLUDING POWER COMPENSATION CIRCUIT AND TEST SYSTEM INC...

SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME

RECEIVING CIRCUIT IN TEST DEVICE, TEST SYSTEM HAVING THE SAME, AND...

SEMICONDUCTOR TEST DEVICES, SYSTEMS INCLUDING THE SAME, AND METHODS...

WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME

APPARATUS FOR TESTING IMAGE SENSOR AND OPERATING METHOD THEREOF

IMAGE SENSOR TEST SYSTEM

TEACHING APPARATUS AND SUBSTRATE ALIGNMENT APPARATUS USING THE SAME

INTERFACE BOARD FOR TESTING IMAGE SENSOR, TEST SYSTEM HAVING THE SA...