Jaewon PARK

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Memory device and test method of memory device
- Patent number 12,266,414
- Issue date Apr 1, 2025
- Samsung Electronics Co., Ltd.
- Jaewon Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test circuits for memory systems having multiple chan...
- Patent number 12,230,345
- Issue date Feb 18, 2025
- Samsung Electronics Co., Ltd.
- Jaewon Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing memory device, memory built-in self test (MBIST)...
- Patent number 11,899,959
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Jaewon Park
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE PERFORMING PROCESSING IN MEMORY AND METHOD OF PERFORM...
- Publication number 20250147728
- Publication date May 8, 2025
- Samsung Electronics Co., Ltd.
- JAEWON PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE, TEST METHOD OF THE MEMORY DEVICE, AND METHOD OF MANU...
- Publication number 20250104791
- Publication date Mar 27, 2025
- Samsung Electronics Co., Ltd.
- Jaewon Park
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE, ELECTRONIC DEVICE, AND OPERATING METHOD OF MEMORY DE...
- Publication number 20240249051
- Publication date Jul 25, 2024
- Samsung Electronics Co., Ltd.
- Sungoh Ahn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE AND TEST METHOD OF MEMORY DEVICE
- Publication number 20230402123
- Publication date Dec 14, 2023
- Samsung Electronics Co., Ltd.
- Jaewon Park
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST CIRCUITS FOR MEMORY SYSTEMS HAVING MULTIPLE CHAN...
- Publication number 20230178166
- Publication date Jun 8, 2023
- Samsung Electronics Co., Ltd.
- Jaewon Park
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF TESTING MEMORY DEVICE, MEMORY BUILT-IN SELF TEST (MBIST)...
- Publication number 20220113889
- Publication date Apr 14, 2022
- Samsung Electronics Co., Ltd.
- Jaewon PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUSINESS DISTRICT INFORMATION PROVISION SYSTEM, BUSINESS DISTRICT I...
- Publication number 20180150855
- Publication date May 31, 2018
- Jaewon PARK
- G06 - COMPUTING CALCULATING COUNTING

Jaewon PARK

Person

Patents Grantslast 30 patents

Memory device and test method of memory device

Built-in self-test circuits for memory systems having multiple chan...

Method of testing memory device, memory built-in self test (MBIST)...

Patents Applicationslast 30 patents

MEMORY DEVICE PERFORMING PROCESSING IN MEMORY AND METHOD OF PERFORM...

MEMORY DEVICE, TEST METHOD OF THE MEMORY DEVICE, AND METHOD OF MANU...

MEMORY DEVICE, ELECTRONIC DEVICE, AND OPERATING METHOD OF MEMORY DE...

MEMORY DEVICE AND TEST METHOD OF MEMORY DEVICE

BUILT-IN SELF-TEST CIRCUITS FOR MEMORY SYSTEMS HAVING MULTIPLE CHAN...

METHOD OF TESTING MEMORY DEVICE, MEMORY BUILT-IN SELF TEST (MBIST)...

BUSINESS DISTRICT INFORMATION PROVISION SYSTEM, BUSINESS DISTRICT I...