JaeWoo Ryu

Person

Chesterfield, MO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Ingot puller apparatus having heat shields with feet having an apex
- Patent number 12,031,229
- Issue date Jul 9, 2024
- GlobalWafers Co., Ltd.
- Jiaying Ke
- C30 - CRYSTAL GROWTH
Information Patent Grant
Systems and methods for production of silicon using a horizontal ma...
- Patent number 11,932,962
- Issue date Mar 19, 2024
- GlobalWafers Co., Ltd.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Grant
Systems and methods for production of silicon using a horizontal ma...
- Patent number 11,873,574
- Issue date Jan 16, 2024
- GlobalWafers Co., Ltd.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Grant
Ingot puller apparatus having heat shields with voids therein
- Patent number 11,873,575
- Issue date Jan 16, 2024
- GlobalWafers Co., Ltd.
- Jiaying Ke
- C30 - CRYSTAL GROWTH
Information Patent Grant
Methods for producing a monocrystalline ingot by horizontal magneti...
- Patent number 11,767,611
- Issue date Sep 26, 2023
- GlobalWafers Co., Ltd.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Grant
Resistivity stabilization measurement of fat neck slabs for high re...
- Patent number 11,739,437
- Issue date Aug 29, 2023
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Grant
Methods for growing a single crystal silicon ingot using continuous...
- Patent number 11,408,090
- Issue date Aug 9, 2022
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Grant
Growth of plural sample rods to determine impurity build-up during...
- Patent number 11,047,066
- Issue date Jun 29, 2021
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Grant
Methods for modeling the impurity concentration of a single crystal...
- Patent number 10,954,606
- Issue date Mar 23, 2021
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Grant
Sample rod growth and resistivity measurement during single crystal...
- Patent number 10,793,969
- Issue date Oct 6, 2020
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Grant
Methods for determining the resistivity of a polycrystalline silico...
- Patent number 10,781,532
- Issue date Sep 22, 2020
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
DOPED PARTICULATE SILICON PARTICLE SIZE SELECTION
- Publication number 20240368801
- Publication date Nov 7, 2024
- GLOBALWAFERS CO., LTD.
- JunHwan Ji
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR PREPARING A SINGLE CRYSTAL SILICON INGOT WITH REDUCED R...
- Publication number 20240279840
- Publication date Aug 22, 2024
- GLOBALWAFERS CO., LTD.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
INGOT PULLER APPARATUS AND METHODS FOR GROWING A SINGLE CRYSTAL SIL...
- Publication number 20240247398
- Publication date Jul 25, 2024
- GLOBALWAFERS CO., LTD.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR PRODUCING SINGLE CRYSTAL SILICON WAFERS FOR INSULATED G...
- Publication number 20240240355
- Publication date Jul 18, 2024
- GLOBALWAFERS CO., LTD.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
SYSTEMS AND METHODS FOR COOLING A CHUNK POLYCRYSTALLINE FEEDER
- Publication number 20240167193
- Publication date May 23, 2024
- GLOBALWAFERS CO., LTD.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Application
INGOT PULLER APPARATUS HAVING A REFLECTOR ASSEMBLY SUSPENDED FROM S...
- Publication number 20240167191
- Publication date May 23, 2024
- GLOBALWAFERS CO., LTD.
- Benjamin Michael Meyer
- C30 - CRYSTAL GROWTH
Information Patent Application
INGOT PULLER APPARATUS THAT AXIALLY POSITION MAGNETIC POLES
- Publication number 20240068123
- Publication date Feb 29, 2024
- GLOBALWAFERS CO., LTD.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Application
SYNTHETIC CRUCIBLES WITH RIM COATING
- Publication number 20240068121
- Publication date Feb 29, 2024
- GLOBALWAFERS CO., LTD.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Application
AXIAL POSITIONING OF MAGNETIC POLES WHILE PRODUCING A SILICON INGOT
- Publication number 20240068122
- Publication date Feb 29, 2024
- GLOBALWAFERS CO., LTD.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR FORMING SINGLE CRYSTAL SILICON INGOTS WITH REDUCED CARB...
- Publication number 20230392281
- Publication date Dec 7, 2023
- GLOBALWAFERS CO., LTD.
- Richard J. Phillips
- C30 - CRYSTAL GROWTH
Information Patent Application
RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RE...
- Publication number 20230340690
- Publication date Oct 26, 2023
- GLOBALWAFERS CO., LTD.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR PRODUCING A PRODUCT INGOT HAVING LOW OXYGEN CONTENT
- Publication number 20230250550
- Publication date Aug 10, 2023
- GLOBALWAFERS CO., LTD.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
MODELING THERMAL DONOR FORMATION AND TARGET RESISTIVITY FOR SINGLE...
- Publication number 20230112094
- Publication date Apr 13, 2023
- GLOBALWAFERS CO., LTD.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
INGOT PULLER APPARATUS HAVING HEAT SHIELDS WITH FEET HAVING AN APEX
- Publication number 20230083235
- Publication date Mar 16, 2023
- GLOBALWAFERS CO., LTD.
- Jiaying Ke
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR PRODUCING SILICON INGOTS BY HORIZONTAL MAGNETIC FIELD C...
- Publication number 20220349087
- Publication date Nov 3, 2022
- GLOBALWAFERS CO., LTD.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Application
SYSTEMS AND METHODS FOR PRODUCTION OF SILICON USING A HORIZONTAL MA...
- Publication number 20220228291
- Publication date Jul 21, 2022
- GLOBALWAFERS CO., LTD.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Application
INGOT PULLER APPARATUS HAVING HEAT SHIELDS WITH VOIDS THEREIN
- Publication number 20220170176
- Publication date Jun 2, 2022
- GLOBALWAFERS CO., LTD.
- Jiaying Ke
- C30 - CRYSTAL GROWTH
Information Patent Application
NON-CONTACT SYSTEMS AND METHODS FOR DETERMINING DISTANCE BETWEEN SI...
- Publication number 20220154365
- Publication date May 19, 2022
- GLOBALWAFERS CO., LTD.
- Benjamin Michael Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INGOT PULLER APPARATUS HAVING A HEAT SHIELD DISPOSED BELOW A SIDE H...
- Publication number 20220145492
- Publication date May 12, 2022
- GlobalWaters Co., Ltd.
- Sumeet S. Bhagavat
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR PRODUCING A MONOCRYSTALLINE INGOT BY HORIZONTAL MAGNETI...
- Publication number 20220025541
- Publication date Jan 27, 2022
- GLOBALWAFERS CO., LTD.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Application
SYSTEMS AND METHODS FOR PRODUCTION OF SILICON USING A HORIZONTAL MA...
- Publication number 20210180206
- Publication date Jun 17, 2021
- GLOBALWAFERS CO., LTD.
- JaeWoo Ryu
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR GROWING A SINGLE CRYSTAL SILICON INGOT USING CONTINUOUS...
- Publication number 20200332439
- Publication date Oct 22, 2020
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RE...
- Publication number 20200208294
- Publication date Jul 2, 2020
- GLOBALWAFERS CO., LTD.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
Center Slab Lapping and Resistivity Measurement During Single Cryst...
- Publication number 20200199773
- Publication date Jun 25, 2020
- GLOBALWAFERS CO., LTD.
- HyungMin Lee
- C30 - CRYSTAL GROWTH
Information Patent Application
Sample Rod Center Slab Resistivity Measurement With Four-Point Prob...
- Publication number 20200199774
- Publication date Jun 25, 2020
- GLOBALWAFERS CO., LTD.
- HyungMin Lee
- C30 - CRYSTAL GROWTH
Information Patent Application
Sample Rod Center Slab Resistivity Measurement During Single Crysta...
- Publication number 20200199775
- Publication date Jun 25, 2020
- GLOBALWAFERS CO., LTD.
- HyungMin Lee
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR MODELING THE IMPURITY CONCENTRATION OF A SINGLE CRYSTAL...
- Publication number 20200002837
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR DETERMINING THE RESISTIVITY OF A POLYCRYSTALLINE SILICO...
- Publication number 20200002835
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
SAMPLE ROD GROWTH AND RESISTIVITY MEASUREMENT DURING SINGLE CRYSTAL...
- Publication number 20200002836
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
GROWTH OF PLURAL SAMPLE RODS TO DETERMINE IMPURITY BUILD-UP DURING...
- Publication number 20200002843
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH

Person

Patents Grantslast 30 patents

Ingot puller apparatus having heat shields with feet having an apex

Systems and methods for production of silicon using a horizontal ma...

Systems and methods for production of silicon using a horizontal ma...

Ingot puller apparatus having heat shields with voids therein

Methods for producing a monocrystalline ingot by horizontal magneti...

Resistivity stabilization measurement of fat neck slabs for high re...

Methods for growing a single crystal silicon ingot using continuous...

Growth of plural sample rods to determine impurity build-up during...

Methods for modeling the impurity concentration of a single crystal...

Sample rod growth and resistivity measurement during single crystal...

Methods for determining the resistivity of a polycrystalline silico...

Patents Applicationslast 30 patents

DOPED PARTICULATE SILICON PARTICLE SIZE SELECTION

METHODS FOR PREPARING A SINGLE CRYSTAL SILICON INGOT WITH REDUCED R...

INGOT PULLER APPARATUS AND METHODS FOR GROWING A SINGLE CRYSTAL SIL...

METHODS FOR PRODUCING SINGLE CRYSTAL SILICON WAFERS FOR INSULATED G...

SYSTEMS AND METHODS FOR COOLING A CHUNK POLYCRYSTALLINE FEEDER

INGOT PULLER APPARATUS HAVING A REFLECTOR ASSEMBLY SUSPENDED FROM S...

INGOT PULLER APPARATUS THAT AXIALLY POSITION MAGNETIC POLES

SYNTHETIC CRUCIBLES WITH RIM COATING

AXIAL POSITIONING OF MAGNETIC POLES WHILE PRODUCING A SILICON INGOT

METHODS FOR FORMING SINGLE CRYSTAL SILICON INGOTS WITH REDUCED CARB...

RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RE...

METHODS FOR PRODUCING A PRODUCT INGOT HAVING LOW OXYGEN CONTENT

MODELING THERMAL DONOR FORMATION AND TARGET RESISTIVITY FOR SINGLE...

INGOT PULLER APPARATUS HAVING HEAT SHIELDS WITH FEET HAVING AN APEX

METHODS FOR PRODUCING SILICON INGOTS BY HORIZONTAL MAGNETIC FIELD C...

SYSTEMS AND METHODS FOR PRODUCTION OF SILICON USING A HORIZONTAL MA...

INGOT PULLER APPARATUS HAVING HEAT SHIELDS WITH VOIDS THEREIN

NON-CONTACT SYSTEMS AND METHODS FOR DETERMINING DISTANCE BETWEEN SI...

INGOT PULLER APPARATUS HAVING A HEAT SHIELD DISPOSED BELOW A SIDE H...

METHODS FOR PRODUCING A MONOCRYSTALLINE INGOT BY HORIZONTAL MAGNETI...

SYSTEMS AND METHODS FOR PRODUCTION OF SILICON USING A HORIZONTAL MA...

METHODS FOR GROWING A SINGLE CRYSTAL SILICON INGOT USING CONTINUOUS...

RESISTIVITY STABILIZATION MEASUREMENT OF FAT NECK SLABS FOR HIGH RE...

Center Slab Lapping and Resistivity Measurement During Single Cryst...

Sample Rod Center Slab Resistivity Measurement With Four-Point Prob...

Sample Rod Center Slab Resistivity Measurement During Single Crysta...

METHODS FOR MODELING THE IMPURITY CONCENTRATION OF A SINGLE CRYSTAL...

METHODS FOR DETERMINING THE RESISTIVITY OF A POLYCRYSTALLINE SILICO...

SAMPLE ROD GROWTH AND RESISTIVITY MEASUREMENT DURING SINGLE CRYSTAL...

GROWTH OF PLURAL SAMPLE RODS TO DETERMINE IMPURITY BUILD-UP DURING...