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Jagat Shakya
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Hillsboro, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Microbump cluster probing architecture for 2.5D and 3D dies
Patent number
12,163,982
Issue date
Dec 10, 2024
Intel Corporation
Jagat Shakya
G01 - MEASURING TESTING
Information
Patent Grant
Sacrificial redistribution layer in microelectronic assemblies havi...
Patent number
11,749,628
Issue date
Sep 5, 2023
Intel Corporation
Adel A. Elsherbini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Apparatuses and methods for monitoring health of probing u-bump clu...
Patent number
11,740,282
Issue date
Aug 29, 2023
Intel Corporation
Jagat Shakya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sacrificial redistribution layer in microelectronic assemblies havi...
Patent number
11,527,501
Issue date
Dec 13, 2022
Intel Corporation
Adel A. Elsherbini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Apparatuses and methods for mitigating sticking of units-under-test
Patent number
11,486,923
Issue date
Nov 1, 2022
Intel Corporation
Jagat Shakya
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ON DIE FLEXURE CONTROL DEVICE AND METHOD
Publication number
20240413031
Publication date
Dec 12, 2024
Intel Corporation
Chandru Periasamy
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED CIRCUIT PACKAGES WITH HYBRID BONDED DIES AND METHODS OF...
Publication number
20240113088
Publication date
Apr 4, 2024
Intel Corporation
Omkar Karhade
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICROBUMP CLUSTER PROBING ARCHITECTURE FOR 2.5D AND 3D DIES
Publication number
20230314479
Publication date
Oct 5, 2023
Intel Corporation
Jagat SHAKYA
G01 - MEASURING TESTING
Information
Patent Application
SACRIFICIAL REDISTRIBUTION LAYER IN MICROELECTRONIC ASSEMBLIES HAV...
Publication number
20230074970
Publication date
Mar 9, 2023
Intel Corporation
Adel A. Elsherbini
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
APPARATUSES AND METHODS FOR MITIGATING STICKING OF UNITS-UNDER-TEST
Publication number
20200182928
Publication date
Jun 11, 2020
Intel Corporation
Jagat Shakya
G01 - MEASURING TESTING