Jagdish Chandra Saraswatula

Follow

Person

Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-scanning electron microscopy for wafer alignment
- Patent number 10,901,391
- Issue date Jan 26, 2021
- Carl Zeiss SMT GmbH
- Jagdish Chandra Saraswatula
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER INSPECTION METHODS AND DEVICES
- Publication number 20210158498
- Publication date May 27, 2021
- Carl Zeiss SMT GMBH
- Jagdish Chandra Saraswatula
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION METHODS AND SYSTEMS
- Publication number 20210073976
- Publication date Mar 11, 2021
- Carl Zeiss SMT GMBH
- Jagdish Chandra Saraswatula
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR DEFINING A PROCESS WINDOW
- Publication number 20200402863
- Publication date Dec 24, 2020
- Carl Zeiss SMT GMBH
- Jagdish Chandra Saraswatula
- G06 - COMPUTING CALCULATING COUNTING